TEM orientation mapping, is becoming an increasingly popular and important technique. There has been significant instrumental development in recent years by the SME involved in JRA1, Nanomegas, enabling precession electron diffraction (PED) patterns to be acquired pixel by pixel across a scanned area. Such 4D data sets can be analysed to provide high  resolution (ca. 1nm) phase-identification and orientation maps.

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ASTAR device uses novel TEM based orientation mapping technique to characterize any material up to 1 nm scale based on collection of precession electron diffraction patterns (PED).

In combination with TOPSPIN simultaneous  orientation /phase /strain /STEM maps are possible.

Novel Automated Strain Mapping Solution for TEM/STEM (Patent pending) based  on nanobeam precession  diffraction patterns and STEM reference image acquisition. Precision up to 0.02% (200kV FEG) with spatial resolution  < 2 nm (FEG  TEM). In combination with TOPSPIN simultaneous  orientation /phase /strain /STEM maps are possible.

3D diffraction tomography in combination with DigiSTAR precession  diffraction device enable automatic reconstruction of reciprocal cell of any material  and solve any nanocrystalline  structure.

Beam Precession with DigiSTAR may enhance EELS & EDX signal reducing channeling effects. EELS quantification  possible via TOPSPIN model based EELS quantification.

TOPSPIN is a digital STEM, beam Precession Electron Diffraction  analytical Experimental framework offering a suite of beam precession imaging and advanced analytical experiments.

NanoMEGAS partners with the largest EU network on Transmission Electron Microscopy

NanoMEGAS is partner of the European  Network for Transmission Electron Microscopy with expertize in electron difffraction/crystallography techniques and TEM orientation imaging

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Microscopy  Today  2011  Innovation  Award  for NanoMEGAS  and CNRS  Grenoble 

At the 2011 Microscopy & Microanalysis meeting in Nashville  Dr Edgar Rauch  (CNRS Grenoble) and Dr. Stavros Nicolopoulos from NanoMEGAS received the Microscopy Today 2011 Innovation Award for development of  ASTAR

PICO 2019
The Fifth Conference on Frontiers of Aberration Corrected Electron Microscopy
6-10  May, 2019

Kasteel Vaalsbroek, The Netherlands

16 éme Colloque de la Societé Française des Microspies
2-5  July, 2019

Poitiers, France

M&M 2019 
Microscopy & Microanalysis 2019
4-8  August, 2019

Portland, Oregon

Microscopy Conference 2019
1-5  Sept, 2018

Berlin, Germany

                     PAST EVENTS

Researchers at Cambridge  University  and NanoMEGAS 

reveal detailed  organic thin film structure  with  ASTAR  

ASTAR and graphene  research on Italian television

ASTAR has been used to check the crystal quality of graphene in the research carried out by the Istituto Italiano di Tecnologia at the Center for Nanotechnology Innovation@NEST in Pisa, Italy.




May 27th-29th, 2019 Amiens, France

Electron Pair Distribution Function (e-PDF)  is an electron diffraction based  technique that allows to analyze  local  order  in  amorphous and  nanocrystalline materials  from diffuse or ring  ED patterns.

e-PDF data can be acquired with any TEM and can be applied to characterize amorphous semiconductors, glass and amorphous minerals , battery materials and in situ studies in liquids in environmental cells.

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