ASTAR device uses novel TEM based orientation mapping technique to characterize any material up to 1 nm scale based on collection of precession electron diffraction patterns (PED).

In combination with TOPSPIN simultaneous  orientation /phase /strain /STEM maps are possible.

Novel Automated Strain Mapping Solution for TEM/STEM (Patent pending) based  on nanobeam precession  diffraction patterns and STEM reference image acquisition. Precision up to 0.02% (200kV FEG) with spatial resolution  < 2 nm (FEG  TEM). In combination with TOPSPIN simultaneous  orientation /phase /strain /STEM maps are possible.

3D diffraction tomography in combination with DigiSTAR precession  diffraction device enable automatic reconstruction of reciprocal cell of any material  and solve any nanocrystalline  structure.

Beam Precession with DigiSTAR may enhance EELS & EDX signal reducing channeling effects. EELS quantification  possible via TOPSPIN model based EELS quantification.

TOPSPIN is a digital STEM, beam Precession Electron Diffraction  analytical Experimental framework offering a suite of beam precession imaging and advanced analytical experiments.

NanoMEGAS partners with the largest EU network on Transmission Electron Microscopy

NanoMEGAS is partner of the European  Network for Transmission Electron Microscopy with expertize in electron difffraction/crystallography techniques and TEM orientation imaging

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Microscopy  Today  2011  Innovation  Award  for NanoMEGAS  and CNRS  Grenoble 

At the 2011 Microscopy & Microanalysis meeting in Nashville  Dr Edgar Rauch  (CNRS Grenoble) and Dr. Stavros Nicolopoulos from NanoMEGAS received the Microscopy Today 2011 Innovation Award for development of  ASTAR

EBSD 2015
March 31-31, 2015
TIC, University of Strathclyde, Glasgow, UK

MMC 2015
June 29 - July 1, 2015
Manchester Central, UK

M&M 2015
August 2-6, 2015
Portland, OR

August 23-28, 2015
Rovinj, Croatia

MCM 2015
August 23-28, 2015
Eger, Hungary

XXIII Conference on Applied Crystallography
September 20-24, 2015

Kraków, Poland

                     PAST EVENTS

Digital STEM for advanced experiments that enables beam scanning with Precession Electron Diffraction and with multin-signal data acquisition in combination with DigiSTAR  and STEM detector or external CCD camera in combination with TOPSPIN.

Article in ASU SCOPE Summer 2013 Newsletter

LeRoy Eyring Center for Solid State Science at Arizona State announces the addition of ASTAR-Topspin-Autostrain System to enhance TEM analytical capabilities. Read center Director Tom Sharp's comments about the installation and use of the ASTAR-Topspin-Autostrain system on their JEOL ARM200F aberration corrected microscope. Find the full on-line version of ASU's SCOPE newsletter here.

Researchers at Cambridge  University  and NanoMEGAS 

reveal detailed  organic thin film structure  with  ASTAR  

TEM orientation mapping, is becoming an increasingly popular and important technique. There has been significant instrumental development in recent years by the SME involved in JRA1, Nanomegas, enabling precession electron diffraction (PED) patterns to be acquired pixel by pixel across a scanned area. Such 4D data sets can be analysed to provide high  resolution (ca. 1nm) phase-identification and orientation maps.

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ASTAR and graphene  research on Italian television

ASTAR has been used to check the crystal quality of graphene in the research carried out by the Istituto Italiano di Tecnologia at the Center for Nanotechnology Innovation@NEST in Pisa, Italy.