ASTAR - Literature:

2010

  1. Portillo J., Rauch E. F., Nicolopoulos S., Gemmi M., Bultreys D. Precession electron diffraction assisted orientation mapping in the transmission electron microscope. Mater. Sc. Forum 644 (2010) 1-7 (DOI:10.4028/www.scientific.net/MSF.644.1)

  2. Jeangros Q., Faes A., Wagner J. B., Hansen T. W., Aschauer U., Van herle J., Hessler-Wyser A., Dunin-Borkowski R. E. In situ redox cycle of a nickel–YSZ fuel cell anode in an environmental transmission electron microscope. Acta Materialia 58 (2010) 4578–4589 (DOI:10.1016/j.actamat.2010.04.019)

  3. Bhattacharyya D., Liu X.-Y.; Genc A., Fraser H. L.,Hoagland R. G., Misra A. Heterotwin formation during growth of nanolayered Al-TiN composites. App. Phys. Lett. 96 (2010) 093113-093116 (DOI: 10.1063/1.3330889)

  4. Ganesh K. J., Rajasekhara S., Bultreys D., Zhou P., Ferreira P. J. Automated Local Texture and Stress Analysis in Cu Interconnects using DSTEM and Precession MicroscopyMicrosc. Microanal. 16 (2010) 1728-1729 (DOI: 10.1017/S1431927610061933)

  5. Brandstetter S., Rauch E. F., Carreau V., Maıtrejean S., Verdier M., Legros M. Pattern size dependence of grain growth in Cu interconnects. Scripta Materialia 63 (2010) 965–968 (DOI: 10.1016/j.scriptamat.2010.07.017)

  6. Rauch E. F., Portillo J., Nicolopoulos S., Bultreys D., Rouvimov S., Moeck P. Automated nanocrystal orientation and phase mapping in the transmission electron microscope on the basis of precession electron diffraction. Zeitschrift für Kristallographie 225 (2010) 103-109 (DOI:10.1524/zkri.2010.1205)

  7. Ganesh K. J., Kawasaki M., Zhou J.P., Ferreira P.J. D-STEM: A Parallel Electron Diffraction Technique Diffraction Technique Applied to Nanomaterials Microsc. Microanal. 16, 614–621 (2010) (DOI:10.1017/S1431927610000334)

  8. Rauch E. F., Véron M. Improving angular resolution of the crystal orientation determined with spot diffraction patterns. Microscopy and Microanalysis 16 (2010) 770-771(DOI: 10.1017/S1431927610059593