ASTAR - Literature:

2011

  1. Descartes S., Desrayaud C., Rauch E. F. Inhomogeneous microstructural evolution of pure iron during high-pressure torsion. Mater. Sc. Engin. A 528 (2011) 3666–3675 (DOI: 10.1016/j.msea.2011.01.029)

  2. Rouvimov S., Moeck P., Hausler I., Neumann W. Nicolopoulos S.,  Automated crystallite orientation and phase mapping in a transmission electron microscope MRS Online Proceedings Library (2011) 1318 (Advances in Spectroscopy and Imaging of Surfaces and Nanostructures)

  3. Brunetti G., Bayle-Guillemaud R. P., Rouviere J. L., Rauch E. F., Martin J. F., Colin J. F., Bertin F., Cayron C. Confirmation of the Domino-Cascade Model by LiFePO4/FePO4 Precession Electron DiffractionChem. Mater.23 (2011) 4515–4524 (DOI: 10.1021/cm201783z)

  4. Rauch E. F., Barmak K., Ganesh J. K., Ferreira P. J., Darbal A., Choi D., Sun T., Yao B., Coffey K. R., Nicolopoulos S. Automated Crystal Orientation and Phase Mapping for Thin Film Applications by Transmission Electron Microscopy. Microsc. Microanal.17 (2011) 1086-1087 (DOI: 10.1017/S1431927611006301)

  5. Moeck P., Rouvimov S., Rauch E. F., Veron M., Kirmse H., Haeusler I., Neumann W., Bultreys D., Maniette Y., Nicolopoulos S. High spatial resolution semi-automatic crystallite orientation and phase mapping of nanocrystals in transmission electron microscopes. Cryst. Res. Techn. 46 (2011) 589-606 (DOI: 10.1002/crat.201000676)

  6. Cizek P., Barnett M. R., Nave M. D., Rauch E. F. Balasubramaniam R. Microscale and Mesoscale Crystalographic Textures of Nanocrystalline Ni-based ElectrodepositsMetall. Mat. Transact. A 42 (2011) 2048-2060 (DOI: 10.1007/s11661-010-0583-x)

  7. Zaefferer S. A Critical review of orientation microscopy in SEM and TEM. Cryst. Res. Techn. 46 (2011) 607-628 (DOI: 10.1002/crat.201100125)

  8. Clement L., Borowiak C., Galand R., Lepinay K., Lorut F., Pantel R., Servanton G., Thomas R., Vannier P., Bicais N. Microscopy needs for next generation devices characterization in the semiconductor industry Journal of Physics: Conference Series 326 (2011) 012008 (DOI:10.1088/1742-6596/326/1/012008)

  9. Ganesh K. J., Rajasekhara S., Bultreys D., Ferreira P. J. Rapid and Automated Grain Orientation and Grain Boundary Analysis in Nanoscale Copper Interconnects Reliability Physics Symposium (IRPS), IEEE International, (2011)  (DOI: 10.1109/IRPS.2011.5784524)

  10. Kulovits A., Wiezorek J. M.K., LaGrange T., Reed B. W., Campbell G. H. Revealing the transient states of rapid solidification in aluminum thin films using ultrafast in situ transmission electron microscopy Philosophical Magazine 91 (2011) 287–296 (DOI: 10.1080/09500839.2011.558030)

  11. Moeck P., Rouvimov S., Häusler I., Neumann W., Nicolopoulos S. Precession electron diffraction & automated crystallite orientation/phase mapping in a transmission electron microscope Nanotechnology (IEEE-NANO), 11th IEEE Conference on (2011)  (DOI: 10.1109/NANO.2011.6144300)

  12. Pavia G., Benner G., Niebel H., Rauch E. F. , Véron M. Crystal orientation mapping via STEM/NBD: improved quality with precession electron diffraction and energy filtering Microscopy and Microanalysis 17 (2011) 1074-1075 (DOI:10.1017/S1431927611006246)

  13. Kulovits A., Wiezorek J. M. K., LaGrange T., Reed B. W., Campbell G. H. Revealing the transient states of rapid solidification in aluminum thin films using ultrafast in situ transmission electron microscopy Philosophical Magazine 91 (2011) 287–296 (DOI: 10.1080/09500839.2011.558030)