ASTAR - Literature:


  1. Mohseni H. Collins P. C. Scharf T. W. Nanocrystalline orientation and phase mapping of textured coatings revealed by precession electron diffractionNanomaterials and Energy 1 (2012) 318-323 (DOI: 10.1680/nme.12.00023)

  2. Darbal A. D., Gemmi M., Portillo J., Rauch E., Nicolopoulos, S. Nanoscale automated phase and orientation mapping in the TEM. Microscopy Today 20 (2012) 40-42 (DOI: 10.1017/S1551929512000818)

  3. Ercolani D., Gemmi M., Nasi L., Rossi F., Pea M., Li A., Salviati G., Beltramand F., Sorba L. Growth of InAs/InAsSb heterostructured nanowires.  Nanotechnology 23 (2012) 115606 (DOI: 10.1088/0957-4484/23/11/115606)

  4. Rauch E. F., Veron M., Nicolopoulos S., Bultreys D. Orientation and phase mapping in TEM microscopy (EBSD-TEM like): applications to materials scienceSolid State Phenomena 186 (2012) 13-15 (DOI: 10.4028/

  5. Wang B., Idrissi H., Galceran M., Colla M. S., Turner S., Hui S., Raskin J. P., Pardoen T., Godet S., Schryvers D. Advanced TEM investigation of the plasticity mechanisms in nanocrystalline freestanding palladium films with nanoscale twins. Int. J. of Plast. 37 (2012) 140–156 (DOI: 10.1016/j.ijplas.2012.04.003)

  6. Estradé S., Portillo J., Mendoza J., Kosta I., Serret M., Müller C., Peiró F. Assessment of misorientation in metallic and semiconducting nanowires using precession electron diffraction. Micron. 43 (2012) 910-915 (DOI: 10.1016/j.micron.2012.03.003)

  7. Ganesh K. J., Darbal A. D., Rajasekhara S., Rohrer G. S., Barmak K., Ferreira P. J. Effect of downscaling nano-copper interconnects on the microstructure revealed by high resolution TEM-orientation-mapping. Nanotechnology 23 (2012), 135702/1-135702/7. (DOI: 10.1088/0957-4484/23/13/135702

  8. Cao L., Ganesh K. J., Zhang L., Ferreira P. J., Ho P. S. Grain Structure Analysis and Implications on Electromigration Reliability for Cu Interconnects Reliability Physics Symposium (IRPS), IEEE International (2012) (DOI: 10.1109/IRPS.2012.6241896)

  9. Carpenter J. S., Liu X., Darbal A.,Nuhfer N. T, McCabe R. J., Vogel S. C., LeDonne J. E., Rollett A. D., Barmak K., Beyerleina I. J., Maraa N. A. A comparison of texture results obtained using precession electron diffraction and neutron diffraction methods at diminishing length scales in ordered bimetallic nanolamellar composites Scripta Materialia 67 (2012) 336-339 (DOI: 10.1016/j.scriptamat.2012.05.018)

  10. Cizek P., Sankaran A., Rauch E. F., Barnett M. R. Observation of (sub)grain clusters in the as-deposited and in situ annealed nanocrystalline nickel using automated crystal orientation mapping Scripta Materialia 67 (2012) 685-688 (DOI: 10.1016/j.scriptamat.2012.07.003)

  11. Companhoni M. V. P., Matheus J. R. G., Marcondes T. L., Pinto A. L. Analysis of microstructure and microhardness of Zr-2.5Nb processed by High-Pressure Torsion (HPT) J Mater Sci (2012) 47:7835–7840 (DOI 10.1007/s10853-012-6454-7)

  12. Kulovits A. K., Facco G., Wiezorek J. M. K. Grain size determination in nano-scale polycrystalline aggregates by precession illumination-hollow cone dark field imaging in the transmission electron microscope Materials Characterization 63 (2012) 17–26  (DOI: 10.1016/j.matchar.2011.10.003)

  13. Mompiou F., Legros M., Radetic T., Dahmen U., Gianola D.S., Hemker K.J. In situ TEM observation of grain annihilation in tricrystalline aluminum films Acta Materialia 60 (2012) 2209–2218 (DOI: 10.1016/j.actamat.2011.12.013)

  14. Nicolopoulos S., Rauch E. F., Véron M., Beausir B.  Novel EBSD-TEM like technique: texture analysis, orientation and phase maps on nanostructured materials Proceedings of EMAS Workshop, 2012

  15. Rajasekhara S., Ganesh K. J., Hattar K., Knappa J. A., Ferreirab P. J. Evidence of metastable hcp phase grains in as-deposited nanocrystalline nickel films Scripta Materialia 67 (2012) 189–192 (DOI: 10.1016/j.scriptamat.2012.04.014)

  16. Rauch E. F., Véron M. The structural state of severely deformed materials analysed with a transmission electron microscope International Symposium on Plastic Deformation and Texture Analysis, 2012

  17. Stróż D.,  Palka J.,  Lekston Z. Nanotexture Studies of NiTi Shape Memory Alloy after Severe Plastic Deformation with the Use of TEM Solid State Phenomena 186 (2012) 90-93 (DOI: 10.4028/

  18. Yoo S. J., Kim J.-G.,Kim C.-Y., Kim E.-M., Lee J.-H., Kim Y.-M., Lee J.-H.,  Kim Y.-M. Characterization of crystallographic properties of GaN thin film using automated crystal orientation mapping with TEM Met. Mater. Int., 18 (2012) (DOI: 997-1001 10.1007/s12540-012-6011-6)