Fronteers  of  Characterization and

Metrology  for  Nanoelectronics

25-28 March , NIST  Gaithersburg  USA 

Fundametals on crystallograohy

Workshop 1-7 April  Univ of Patras

(download  pdf)

Quantitative Electron Microscopy

2013  13-24 May St Augullf  France

Edge 2013 26-31  May

Powder  and   Electron

Crystallography workshop  8-12 July

Univ   of  Patras

Microscopy and Microanalysis,

Indianapolis USA  4-8 Aug

MC 2013  Regensburg  Germany

25-29 Aug  2013

ECM 28  European Crystallographic

Association Meeting Warwick UK

25-29 Aug 2013

PICO  2013 Fronteers of aberration

corrected electron microscopy


Kasteel Vaalsbroek , The Netherlands 

9-12  Oct-2013                                        

EMAG Conference, York  UK

Workshop on Precession Electron

Diffraction, and Orientation & Strain

Mapping in TEM

8 Nov 2013 UCLA (download pdf)

Electron Crystallography School – Introduction to electron diffraction tomography

07.4.2014 – 11.04.2014, Darmstadt


ASTAR device uses novel TEM based orientation mapping technique to characterize any material up to 1 nm scale based on collection of precession electron diffraction patterns (PED).

In combination with TOPSPIN simultaneous  orientation /phase /strain /STEM maps are possible.

Novel Automated Strain Mapping Solution for TEM/STEM (Patent pending) based  on nanobeam precession  diffraction patterns and STEM reference image acquisition. Precision up to 0.02% (200kV FEG) with spatial resolution  < 2 nm (FEG  TEM). In combination with TOPSPIN simultaneous  orientation /phase /strain /STEM maps are possible.

3D diffraction tomography in combination with DigiSTAR precession  diffraction device enable automatic reconstruction of reciprocal cell of any material  and solve any nanocrystalline  structure.

Beam Precession with DigiSTAR may enhance EELS & EDX signal reducing channeling effects. EELS quantification  possible via TOPSPIN model based EELS quantification.

TOPSPIN is a digital STEM, beam Precession Electron Diffraction  analytical Experimental framework offering a suite of beam precession imaging and advanced analytical experiments.

NanoMEGAS partners with the largest EU network on Transmission Electron Microscopy

NanoMEGAS is partner of the European  Network for Transmission Electron Microscopy with expertize in electron difffraction/crystallography techniques and TEM orientation imaging

Read more at :

Microscopy  Today  2011  Innovation  Award  for NanoMEGAS  and CNRS  Grenoble 

At the 2011 Microscopy & Microanalysis meeting in Nashville  Dr Edgar Rauch  (CNRS Grenoble) and Dr. Stavros Nicolopoulos from NanoMEGAS received the Microscopy Today 2011 Innovation Award for development of  ASTAR

Digital STEM for advanced experiments that enables beam scanning with Precession Electron Diffraction and with multin-signal data acquisition in combination with DigiSTAR  and STEM detector or external CCD camera in combination with TOPSPIN.

Article in ASU SCOPE Summer 2013 Newsletter

LeRoy Eyring Center for Solid State Science at Arizona State announces the addition of ASTAR-Topspin-Autostrain System to enhance TEM analytical capabilities. Read center Director Tom Sharp's comments about the installation and use of the ASTAR-Topspin-Autostrain system on their JEOL ARM200F aberration corrected microscope. Find the full on-line version of ASU's SCOPE newsletter here.

Researchers at Cambridge  University  and NanoMEGAS 

reveal detailed  organic thin film structure  with  ASTAR  

TEM orientation mapping, is becoming an increasingly popular and important technique. There has been significant instrumental development in recent years by the SME involved in JRA1, Nanomegas, enabling precession electron diffraction (PED) patterns to be acquired pixel by pixel across a scanned area. Such 4D data sets can be analysed to provide high  resolution (ca. 1nm) phase-identification and orientation maps.

Read More

ASTAR and graphene  research on Italian television

ASTAR has been used to check the crystal quality of graphene in the research carried out by the Istituto Italiano di Tecnologia at the Center for Nanotechnology Innovation@NEST in Pisa, Italy.