Digital STEM & TEM imaging

 

Synchronized  beam scanning and precession diffraction

with multi-signal data acquisition


Advanced control of NanoMEGAS DigiSTAR and

external optical CCD camera

Digital STEM imaging with beam precession control

PED patterns from  multiple discrete points, lines and areas

Assisted calibrations (camera length, distortion correction)

On-line distortion corrected diffraction pattern acquisition

Improved workflow  Phase and Orientation Mapping


STEM image acquisition


BF / DF /HAADF   from STEM detectors present on the TEM
Virtual BF/DF via external optical   CCD

Video-rate imaging using external optical CCD camera

(binocular position)

Multiple scan modes (spot, line, area, …)

Fast acquisition of diffraction patterns

On-line distortion correction

Suite of image processing features