ENHANCED EELS & EDX SPECTROSCOPY

 

Beam Precession in EELS & EDX spectroscopy enhance the signal  reducing channeling effects. Automated quantification with statistical error analysis is available. Multiple scattering derived from an automatically measured relative thickness.

CLICK  HERE   for proof of concept outlined by S. Estradé, et al., EELS signal enhancement by means of beam precession in the TEM, Ultramicroscopy (2012)

Requires presence of an EELS and/or EDX spectrometer

EELS quantification possible via TOPSPIN model-based EELS Quantification

Identify elements to quantify

REFERENCES


Reduction of electron channeling in EDS using precession                                  

Yifeng Liao, LaurenceD.Marks                                                                                                 

Ultramicroscopy 126 (2013) 19–22

 

EELS signal enhancement by means of beam precession

in the TEM                    

Sonia Estrade, Joaquim Portillo, Lluis Yedra, Jose Manuel Rebled,

Francesca Peiro

Ultramicroscopy  (2013)

Highly-automated EELS elemental analysis


Minimal user input required

Specify elements to quanitfy
Chemical shift of each elemental edge

Automated quantification with statistical error analysis

Multiple scattering derived from an automatically measured relative thickness

Elemental core-loss edges from several possible sources :

Theoretical : Hartree-Slater (Rez)
Experimental edges from reference materials

Intuitive workflow

Automated quantifications with statistical error analysis