Materials science properties (metals, alloys, ceramics, semiconductors, nanoparticles) depend  on great  extent  on their textures  at nm scale level. ASTAR device uses TEM based orientation mapping technique (EBSD-TEM like) based on collection of precession electron diffraction (PED)  patterns and cross-correlation  comparison with simulated  intensities.

ASTAR can turn any TEM into a very powerful analytical tool enabling orientation–phase imaging at 1 nm resolution attainable (FEG TEM) in combination with other TEM analytical techniques. In combination with TOPSPIN simultaneous orientation/phase/strain /STEM maps are possible.

Texture of metals is linked to specific physical properties so the need to characterize it at nm scale with novel ASTAR orientation imaging technique.

Faster chip performances in electronic devices push copper interconnects at

< 3  nm  scale , so the need

for novel TEM  based  texture

ASTAR characterization technique.

  1. ASTAR  works  with  any TEM 120-200-300 KV  (LaB6/FEG)

  1. ASTAR orientation-phase  map  1 nm  resolution attainable with TEM-FEG

  1. ASTAR may work  with  any type of diffracting material (inorganic, organic) using standard  TEM specimen preparation  techniques

  1. ASTAR works  in combination with  precession diffraction  (Patent pending  technique) device  DigiSTAR for ultra-precise  orientation/phase  maps

  1. ASTAR can work  / retrofit between multiple TEMs in same lab

  1. Galvanic isolation system (GIS) via  optical  fiber  for ASTAR-TEM connection 

  1. In combination with TOPSPIN simultaneous  orientation /phase /strain /STEM maps are possible

Nanoparticle crystal structure and texture are very importan for drug delivery and catalysis properties and need novel TEM characterization techniques.

Crystalline polymers and other  organics  need new techniques for structure characterization in TEM  (ASTAR).

Application  notes  (ASTAR)

  1. Crystal orientation imaging of organic nanomagnets

Textures of minerals at nm scale are intimately linked to their physical & chemical properties so the need for novel TEM characterization techniques (ASTAR).