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TEM orientation mapping, is becoming an increasingly popular and important technique. There has been significant instrumental development in recent years by the SME involved in JRA1, Nanomegas, enabling precession electron diffraction (PED) patterns to be acquired pixel by pixel across a scanned area. Such 4D data sets can be analysed to provide high  resolution (ca. 1nm) phase-identification and orientation maps.

Researchers at Cambridge have been collaborating with Nanomegas to use a rapid scanning approach as a way to minimise beam-dose for beam-sensitive materials such as organic crystals and pharmaceuticals, whilst retaining key crystallographic information. In the figure on the right, we show an example of an orientation map recorded from an organic thin film. Conventional bright-field and dark-field imaging is possible, although challenging, but it does not contain the wealth of orientation information using this diffraction-imaging approach. In the image the remarkable ribbon or fibre-like microstructure of the films is clearly identified; the false colour indicates different orientations of the crystal  structure (Reprinted  from ESTEEEM 2 Newsletter)

ASTAR device uses novel TEM based orientation mapping technique to characterize any material up to 1 nm scale based on collection of precession electron diffraction patterns (PED).

In combination with TOPSPIN simultaneous  orientation /phase /strain /STEM maps are possible.

Novel Automated Strain Mapping Solution for TEM/STEM (Patent pending) based  on nanobeam precession  diffraction patterns and STEM reference image acquisition. Precision up to 0.02% (200kV FEG) with spatial resolution  < 2 nm (FEG  TEM). In combination with TOPSPIN simultaneous  orientation /phase /strain /STEM maps are possible.

3D diffraction tomography in combination with DigiSTAR precession  diffraction device enable automatic reconstruction of reciprocal cell of any material  and solve any nanocrystalline  structure.

Beam Precession with DigiSTAR may enhance EELS & EDX signal reducing channeling effects. EELS quantification  possible via TOPSPIN model based EELS quantification.

TOPSPIN is a digital STEM, beam Precession Electron Diffraction  analytical Experimental framework offering a suite of beam precession imaging and advanced analytical experiments.


NanoMEGAS partners with the largest EU network on Transmission Electron Microscopy



NanoMEGAS is partner of the European  Network for Transmission Electron Microscopy with expertize in electron difffraction/crystallography techniques and TEM orientation imaging


Read more at : www.esteem2.eu




Microscopy  Today  2011  Innovation  Award  for NanoMEGAS  and CNRS  Grenoble 


At the 2011 Microscopy & Microanalysis meeting in Nashville  Dr Edgar Rauch  (CNRS Grenoble) and Dr. Stavros Nicolopoulos from NanoMEGAS received the Microscopy Today 2011 Innovation Award for development of  ASTAR


Digital STEM for advanced experiments that enables beam scanning with Precession Electron Diffraction and with multin-signal data acquisition in combination with DigiSTAR  and STEM detector or external CCD camera in combination with TOPSPIN.

Article in ASU SCOPE Summer 2013 Newsletter



LeRoy Eyring Center for Solid State Science at Arizona State announces the addition of ASTAR-Topspin-Autostrain System to enhance TEM analytical capabilities. Read center Director Tom Sharp's comments about the installation and use of the ASTAR-Topspin-Autostrain system on their JEOL ARM200F aberration corrected microscope. Find the full on-line version of ASU's SCOPE newsletter here.


8th Microscopy Winter School
January 19-24, 2014
ETH and University of Zurich, Switzerland


Electron Backscatter Diffraction

(EBSD) Meeting
March 31 - April 1, 2014
Charles Darwin House, London, UK


Electron Crystallography School

Introduction to electron diffraction

tomography
April 7-11, 2014
Darmstadt, Germany


Microscience Microscopy Congress

2014 (mmc2014)
July 1-3, 2014
Manchester Central, Manchester, UK


IMC2014
September 7-12, 2014
Prague, Czech Republic


XV International Conference on

Electron Microscopy
September 15-18, 2014

Kraków, Poland


                     PAST EVENTS

Researchers at Cambridge  University  and NanoMEGAS 

reveal detailed  organic thin film structure  with  ASTAR  

ASTAR and graphene  research on Italian television

ASTAR has been used to check the crystal quality of graphene in the research carried out by the Istituto Italiano di Tecnologia at the Center for Nanotechnology Innovation@NEST in Pisa, Italy.

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