Modern electron diftraction techniques in transmission electron microscopy have become increasingly imporlant in recent years State-of-the art hard- and software which combine electron beam precession with scanning transmission electron microscopy (STEM), have led to novel orientation mapping techniques that now allow a highly detailed characterization or any material down to the nanometer scale.
This free of charge seminar will give participants a consolidated overview of solutions offered by JEOL, EMSIS and Nanomegas. The main focus wiII be on electron diffraction techniques. In particular precession electron diffraction (PED). This seminar will cover introductions of the newest TEMs, detectors, PED equipment and techniques as well as live demonstrations
This one day seminar will be followed by a one day workshop, where participants will be able to explore the practical aspects of precession electron dilfraction. During hands-on training with JEOL and Nanomegas applications specialist, participants will learn more about acquisition, optimization and processing of precession electron diffraction data.