ADVANCED IMAGING AND DIFFRACTION TOOLS FOR TRANSMISSION ELECTRON MICROSCOPY
In order to test novel materials in challenging working conditions (heat , stress, liquid environment etc) is important to use dedicated TEM holders in combination with ASTAR orientation /phase maps , as well as strain maps to monitor in real time structural changes in engineering materials.
The use of Precession Diffraction for in situ Cross-correlative microscopy
Prof. Greg Thomson, University of Alabama
Combining in situ TEM and Orientation mapping/understanding the deformation and annealing
Dr. Christian Kuebel KIT , Germany Institute of Nanotechnology
ASTAR- IN SITU HEATING EXPERIMENTS
Brons, J. G., et al. “A Comparison of Grain Boundary Evolution during Grain Growth in Fcc Metals.” Acta Materialia, vol. 61, no. 11, Acta Materialia Inc., 2013, pp. 3936–44,doi:10.1016/j.actamat.2013.02.057.
Kulovits, A., et al. “Revealing the Transient States of Rapid Solidification in Aluminum Thin Films Using Ultrafast in Situ Transmission Electron Microscopy.” Philosophical Magazine Letters, vol. 91, no. 4, 2011, pp. 287–96, doi:10.1080/09500839.2011.558030.