INSTRUMENTATION & TECHNIQUES

4D-STEM in TEM using ASTAR technique is based on collection of precession electron diffraction patterns (PED) . ASTAR can turn any TEM into a powerful analytical tool enabling orientation /phase maps down to 1 nm resolution and can apply to any material. Digistar hardware precession unit in combination with 3D electron diffraction tomography can solve crystal structure of any nanocrystal. Topspin strain combines PED with automated strain mapping with nm resolution.

PUBLICATIONS

ASTAR –INSTRUMENTATION & TECHNIQUES

Rauch, E. F., et al. “Coupled Microstructural Observations and Local Texture Measurements with an Automated Crystallographic Orientation Mapping Tool Attached to a Tem.” Materialwissenschaft Und Werkstofftechnik, vol. 36, no. 10, 2005,pp.552–56,doi:10.1002/mawe.200500923.

ASTAR – SPED

Valery, A., et al. “Dealing With Multiple Grains in TEM Lamellae Thickness for Microstructure Analysis Using Scanning Precession Electron Diffraction.” Microscopy and Microanalysis, vol. 21, no. S3, 2015, pp. 1243–44, doi:10.1017/s143192761500700x.

ASTAR – HOLOGRAPHY

Cantu-Valle, J., et al. “Mapping the Magnetic and Crystal Structure in Cobalt Nanowires.” Journal of Applied Physics, vol. 118, no. 2, 2015, doi: 10.1063/1.4923745.

Ortega, E., et al. “In-Situ Magnetization/Heating Electron Holography to Study the Magnetic Ordering in Arrays of Nickel Metallic Nanowires.” AIP Advances, vol. 8, no.5,2018,pp.1–5,doi:10.1063/1.5007671.

I.M.Andersen et al “Exotic transverse-vortex magnetic configurations in CoNi Nanowires” ACS Nano doi:10.1021/acsnano.9b07448

ASTAR & ATOM PROBE

Toji, Y., et al. “Atomic-Scale Analysis of Carbon Partitioning between Martensite and Austenite by Atom Probe Tomography and Correlative Transmission Electron Microscopy.” Acta Materialia, vol. 65, Acta Materialia Inc., 2014, pp. 215–28, doi:10.1016/j.actamat.2013.10.064.

ASTAR & 3D ELECTRON DIFFRACTION TOMOGRAPHY

Baraldi, A., et al. “Eu Incorporation into Sol-Gel Silica for Photonic Applications: Spectroscopic and TEM Evidences of α-Quartz and Eu Pyrosilicate Nanocrystal Growth.” Journal of Physical Chemistry C, vol. 117, no. 50, 2013, pp. 26831–48, doi:10.1021/jp4101174.

STRAIN

P. Rottman PHD dissertation 2017 J.Hopkins University Experimental characterization of deformation mechanisms in nanocrystalline thin films using in situ techniques https://jscholarship.library.jhu.edu/handle/1774.2/40868

P.Rottman, K.Hemker Nanoscale elastic strain mapping of polycrystalline materials MATER. RES. LETT., 2018 VOL. 6, NO. 4, 249–254 https://doi.org/10.1080/21663831.2018.1436609

S.Xiang et al Tuning the deformation mechanisms of boron carbide via silicon doping Sci. Adv. 2019; 5 : DOI: 10.1126/sciadv.aay0352

A.Bashir et al Strain analysis of a Ge micro disk using precession electron diffraction J.of Applied Physics 2020 DOI: 10.1063/1.5113761

A.D Darbal et al Automated High Precision Strain Measurement Using Nanobeam Diffraction Coupled with Precession Microscopy &Microanalysis 2013 doi:10.1017/S1431927613005503

A.D Darbal et al Applications of Automated High Resolution Strain Mapping in TEM on the Study of Strain Distribution in MOSFETs Microsc. Microanal. 20 (Suppl 3), 2014 doi:10.1017/S1431927614007053

M.Reisinger et al Cross-sectional stress distribution in AlxGa1-xN heterostructure on Si(111) substrate characterized by ion beam layer removal method and precession electron diffraction Materials and Design 106 (2016) 476–481 http://dx.doi.org/10.1016/j.matdes.2016.06.001

3D ELECTRON DIFFRACTION TOMOGRAPHY – INSTRUMENTATION AND TECHNIQUES

Kolb, U., et al. “Towards Automated Diffraction Tomography: Part I-Data Acquisition.” Ultramicroscopy, vol. 107, no. 6–7, 2007, pp. 507–13, doi:10.1016/j.ultramic.2006.10.007.
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