Strain – nanoscale – Literature:

Darbal, A. D., et al. “Automated High Precision Strain Measurement Using Nanobeam Diffraction Coupled with Precession.” Microscopy and Microanalysis, vol. 19, no. S2, 2013, pp. 702–03, doi:10.1017/s1431927613005503.

Masadeh, A. S., et al. “Quantitative Size-Dependent Structure and Strain Determination of CdSe Nanoparticles Using Atomic Pair Distribution Function Analysis.” Physical Review B – Condensed Matter and Materials Physics, vol. 76, no. 11, 2007, pp. 1–11, doi:10.1103/PhysRevB.76.115413.

Béché, A., et al. “Strain Measurement at the Nanoscale: Comparison between Convergent Beam Electron Diffraction, Nano-Beam Electron Diffraction, High Resolution Imaging and Dark Field Electron Holography.” Ultramicroscopy, vol. 131, no. 2013, Elsevier, 2013, pp. 10–23, doi:10.1016/j.ultramic.2013.03.014.

Darbal, A. D., et al. “Applications of Automated High Resolution Strain Mapping in TEM on the Study of Strain Distribution in MOSFETs.” Microscopy and Microanalysis, vol. 20, no. 3, 2014, pp. 1066–67, doi:10.1017/S1431927614007053.

Reisinger, M., et al. “Cross-Sectional Stress Distribution in AlxGa1-xN Heterostructure on Si(111) Substrate Characterized by Ion Beam Layer Removal Method and Precession Electron Diffraction.” Materials and Design, vol. 106, Elsevier Ltd, 2016, pp. 476–81, doi:10.1016/j.matdes.2016.06.001.

Rottmann, P. F., et al. “Nanoscale Elastic Strain Mapping of Polycrystalline Materials.” Materials Research Letters, vol. 6, no. 4, Taylor & Francis, 2018, pp. 249–54, doi:10.1080/21663831.2018.1436609.

Bashir, A., et al. “Strain Analysis of a Ge Micro Disk Using Precession Electron Diffraction.” Journal of Applied Physics, vol. 126, no. 23, AIP Publishing LLC, 2019, doi:10.1063/1.5113761.

Xiang, S., et al. “Tuning the Deformation Mechanisms of Boron Carbide via Silicon Doping.” Science Advances, vol. 5, no. 10, 2019, pp. 1–7, doi:10.1126/sciadv.aay0352.

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