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“ACOM‐TEM and its application for the investigation of deformation pathways in nanocrystalline Pd and AuPd”

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Webinar Webinar Extending TEM capabilities with Scanning Precession Electron Diffraction (PED) - Dr. Jing Lu

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Webinar Webinar The use of Precession Diffraction for in situ Cross-correlative microscopy - Prof. Greg Thomson

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Webinar Webinar Advance Characterization of materials using PED /ACOM (ASTAR) - Partha Ghosal

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Webinar Webinar Structural Characterization in TEM by Electron Pair Distribution function (e-PDF) - Partha das

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Webinar Webinar Structural Characterization in TEM by 3D Electron Diffraction / Micro-ED - Partha Das

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Webinar Webinar ASTAR a tool to characterize Na mechanism inside individual crystals of Na-ion battery materials - Arnaud Demortière

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