“ACOM-TEM and Its Application for the Investigation of Deformation Pathways in Nanocrystalline Pd and AuPd.” European Microscopy Congress : Proceedings, vol. 225, no. 1, pp. 191–92 by emc32-adm | Jan 1, 2016 | 0 comments Submit a Comment Cancel replyYour email address will not be published. Required fields are marked *Comment * Name * Email * Website Save my name, email, and website in this browser for the next time I comment.