“Applications of Automated High Resolution Strain Mapping in TEM on the Study of Strain Distribution in MOSFETs.” Microscopy and Microanalysis, vol. 20, no. 3, pp. 1066–67 by emc32-adm | Jan 1, 2014 | 0 comments Submit a Comment Cancel replyYour email address will not be published. Required fields are marked *Comment * Name * Email * Website Save my name, email, and website in this browser for the next time I comment.