“Automated Crystal Orientation and Phase Mapping for Thin Film Applications by Transmission Electron Microscopy.” Microscopy and Microanalysis, vol. 17, no. S2, pp. 1086–87 by emc32-adm | Jan 1, 2011 | 0 comments Submit a Comment Cancel replyYour email address will not be published. Required fields are marked *Comment * Name * Email * Website Save my name, email, and website in this browser for the next time I comment.