“Automated High Precision Strain Measurement Using Nanobeam Diffraction Coupled with Precession.” Microscopy and Microanalysis, vol. 19, no. S2, pp. 702–03 by emc32-adm | Jan 1, 2013 | 0 comments Submit a Comment Cancel replyYour email address will not be published. Required fields are marked *Comment * Name * Email * Website Save my name, email, and website in this browser for the next time I comment.