“Extrax: An ImageJ Plug-in for Electron Diffraction Intensity Extraction.” Journal of Applied Crystallography, vol. 43, no. 1, International Union of Crystallography, pp. 191–95 by emc32-adm | Jan 1, 2010 | 0 comments Submit a Comment Cancel replyYour email address will not be published. Required fields are marked *Comment * Name * Email * Website Save my name, email, and website in this browser for the next time I comment.