“Extrax: An ImageJ Plug-in for Electron Diffraction Intensity Extraction.” Journal of Applied Crystallography, vol. 43, no. 1, International Union of Crystallography, pp. 191–95
by emc32-adm | Jan 1, 2010 | 0 comments
by emc32-adm | Jan 1, 2010 | 0 comments
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