“Grain Boundary Character Distribution of Nanocrystalline Cu Thin Films Using Stereological Analysis of Transmission Electron Microscope Orientation Maps.” Microscopy and Microanalysis, vol. 19, no. 1, pp. 111–19

by emc32-adm | Jan 1, 2013 | 0 comments

Submit a Comment Cancel reply

Your email address will not be published. Required fields are marked *

Comment *

Name *

Email *

Website

Save my name, email, and website in this browser for the next time I comment.