“Height-Resolved Quantification of Microstructure and Texture in Polycrystalline Thin Films Using TEM Orientation Mapping.” Ultramicroscopy, vol. 159, no. P1, Elsevier, pp. 112–23 by emc32-adm | Jan 1, 2015 | 0 comments Submit a Comment Cancel replyYour email address will not be published. Required fields are marked *Comment * Name * Email * Website Save my name, email, and website in this browser for the next time I comment.