“In-Situ Indentation and Correlated Precession Electron Diffraction Analysis of a Polycrystalline Cu Thin Film.” JOM, vol. 70, no. 7, Springer US, pp. 1081–87 by emc32-adm | Jan 1, 2018 | 0 comments Submit a Comment Cancel replyYour email address will not be published. Required fields are marked *Comment * Name * Email * Website Save my name, email, and website in this browser for the next time I comment.