“Refinement of Cryo-EM Structures Using Scattering Factors of Charged Atoms.” Journal of Applied Crystallography, vol. 49, no. 5, pp. 1517–23 by emc32-adm | Jan 1, 2016 | 0 comments Submit a Comment Cancel replyYour email address will not be published. Required fields are marked *Comment * Name * Email * Website Save my name, email, and website in this browser for the next time I comment.