Revealing the Transient States of Rapid Solidification in Aluminum Thin Films Using Ultrafast in Situ Transmission Electron Microscopy.” Philosophical Magazine Letters, vol. 91, no. 4, pp. 287–96
by emc32-adm | Jan 1, 2011 | 0 comments
by emc32-adm | Jan 1, 2011 | 0 comments
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