ADVANCED IMAGING AND DIFFRACTION TOOLS
FOR TRANSMISSION ELECTRON MICROSCOPY

“Structural Analysis of Strained LaVO3 Thin Films.” Journal of Physics Condensed Matter, vol. 27, no. 17, IOP Publishing, p. 175001

by | Jan 1, 2015 | 0 comments

Submit a Comment

Your email address will not be published.

To download the content of the Webinar, please fill out the following form: