PRODUCTS & SOLUTIONS
TEM ORIENTATION IMAGING
PHASE MAPPING –ASTAR
ASTAR device uses novel TEM based orientation/phase mapping technique to characterize any material down to 1 nm scale based on collection of precession electron diffraction patterns (PED). In combination with TOPSPIN acquisition of orientation / phase / strain/ STEM maps is possible
TEM STRAIN MAPPING ANALYSIS
Novel Automated Strain Mapping Solution for TEM/STEM (Patent pending) based on nanobeam precession diffraction patterns and STEM reference image acquisition. Precision up to 0.02% (200kV FEG) with spatial resolution < 2 nm (FEG TEM). In combination with TOPSPIN acquisition of orientation /phase /strain /STEM maps is possible.
4D STEM WITH TOPSPIN PLATFORM
Scanned acquisition with Precession electron diffraction . TOPSPIN is a digital STEM, beam Precession Electron Diffraction analytical Experimental framework offering a suite of beam precession imaging and advanced analytical experiments.
3D PRECESSION DIFFRACTION TOMOGRAPHY – MICRO ED
3D diffraction tomography in combination with DigiSTAR and precession diffraction device enable automatic reconstruction of reciprocal space, unit cell determination and crystal structure solution of any material
ANALYSIS OF AMORPHOUS MATERIALS
e-PDF software suite uses Electron Pair Distribution Function (electron diffraction based technique) that allows to analyze local order in amorphous and nanocrystalline materials from diffuse or ring ED patterns.
ELECTRIC-MAGNETIC FIELD MAPPING
4D-SPED acquisition in combination with DigiSTAR and precession diffraction can be applied to characterize local electric or magnetic fields in materials ike transistors, sensors, nanowires, batteries etc. by detecting shift of the intensity distribution of the transmited central electron beam.
APPLICATIONS
NEWS
NanoMEGAS
NanoMEGAS application meeting at our Brussels location with the friendly participation of our partners from 4MAT ULB and SIMaP INP Grenoble!
Many surprises and innovations are expected in the coming months to make 4D STEM techniques more accessible, powerful and automated, especially with a coupling offer for the new fast hybrid pixel detectors that allow access to more sensitive materials.
Today we are proud not only of the more than 300 installations in various TEMs all over the world but also of the more than 1000 scientific publications in precession diffraction related fields coming from various scientific laboratories.
Date: 2nd September 2025
12:45-13:45 (CET; UTC+1)
Join us for an engaging luncheon seminar that will begin with an introduction to Precession Enhanced Applications in TEM for nanomaterial Studies. Leading scientists will showcase recent advancements using the PED technique, offering a unique opportunity to explore cutting-edge applications such as Orientation and Phase Mapping (ASTAR) and Strain Mapping (TopSPIN).
To secure your spot at this exciting event, please register by sending a confirmation email to tgalanis@nanomegas.com. Due to limited seating, we recommend registering early to avoid disappointment.
Participation is free of charge, and a light lunch will be provided!
Don’t miss this chance to deepen your knowledge of the latest developments in nanomaterial research.
EMSIS & NanoMEGAS are exhibiting during MC2025!
We will be glad to welcome you to booth No 27 in exhibition area.
We look forward to seeing you there!
NanoMEGAS and EMSIS
Schedule
12:45h - 12:55h - Dr. Thanos GALANIS
Precession Enhanced ED Applications in TEM for Nanomaterials Studies.
Dr. Thanos GALANIS, NanoMEGAS, application specialist.
12:55h - 13:20h - Prof. Kerstin Volz
Scanning Precession Electron Diffraction in Battery Research: Uncovering Phase Transitions, Defects, and Internal Misorientation in Cathode Active Materials
Prof. Kerstin Volz, Department of Physics and Materials Science Center, Philipps-University Marburg
13:20h - 13:45h - Dr. Dan Zhou
In situ nanometer-resolution strain and orientation mapping for gas-solid reactions via precession-assisted 4D-STEM.
Dr. Dan Zhou, Leibniz-Institut für Kristallzüchtung (IKZ), Berlin
Special issue in MDPI
Symmetry for Electron Diffraction and Structrural Imaging I & II
MDPI special issues include a total of 19 published papers including contributions from important researchers in the field of electron crystallography and from leading Electron Diffraction device Manufacturers.
Dr. Partha Pratim Das, Dr. Arturo Ponce-Pedraza,
Dr. Enrico Mugnaioli, Dr. Stavros Nicolopoulos
Symmetry | Special Issue: Electron Diffraction and Structural Imaging I (mdpi.com)
Symmetry | Special Issue: Electron Diffraction and Structural Imaging II (mdpi.com)
EVENTS
