AMORPHOUS & NANOCRYSTALLINE MATERIALS

Amorphous and nanocrystalline materials local order can be analyzed with ASTAR and e-PDF (electron Pair Distribution function) techniques. e-PDF can be acquired with any TEM and can be applied to characterize amorphous semiconductors, glass, amorphous minerals , battery materials and in situ studies in liquids in environmental cells.

WEBINARS

Local structure at the nanoscale (e-PDF)

Prof. Simon Billinge , Columbia University

Structural Characterization in TEM by Electron Pair Distribution function (e-PDF)

Dr. Partha Das Application Scientist NanoMEGAS Belgium

PUBLICATIONS

e-PDF AMORPHOUS-NANOCRYSTALLINE MATERIALS

Proffen, T., et al. “Structural Analysis of Complex Materials Using the Atomic Pair Distribution Function – A Practical Guide.” Zeitschrift Fur Kristallographie, vol. 218, no. 2, 2003, pp. 132–43, doi:10.1524/zkri.218.2.132.20664.

Billinge, S. J. L, et al. “Beyond Crystallography: The Study of Disorder, Nanocrystallinity and Crystallographically Challenged Materials with Pair Distribution Functions.” Chemical Communications, vol. 4, no. 7, 2004, pp. 749–60, doi:10.1039/b309577k.

Petkov, V., et al. “Three-Dimensional Structure of Nanocomposites from Atomic Pair Distribution Function Analysis: Study of Polyaniline and (Polyaniline)0.5V2O5·1.0H2O.” Journal of the American Chemical Society, vol. 127, no. 24, 2005, pp. 8805–12, doi:10.1021/ja051315n.

Kovács Kis, V., et al. “Amorphous and Partly Ordered Structures in SiO2 Rich Volcanic Glasses. An ED Study.” European Journal of Mineralogy, vol. 18, no. 6, 2006, pp. 745–52, doi:10.1127/0935-1221/2006/0018-0745.

Kovács Kis, V., et al. “Nanostructure of Atmospheric Soot Particles.” Atmospheric Environment, vol. 40, no. 29, 2006, pp. 5533–42, doi:10.1016/j.atmosenv.2006.05.012.

Billinge, S. J. L. “Nanostructure Studied Using the Atomic Pair Distribution Function.” Zeitschrift Fur Kristallographie, Supplement, vol. 1, no. 26, 2007, pp. 17–26, doi:10.1524/zksu.2007.2007.suppl_26.17.

Abeykoon, M., et al. “Quantitative Nanostructure Characterization Using Atomic Pair Distribution Functions Obtained from Laboratory Electron Microscopes.” Zeitschrift Fur Kristallographie, vol. 227, no. 5, 2012, pp. 248–56, doi:10.1524/zkri.2012.1510.

Abeykoon, A. M. M.., et al. “Calibration and Data Collection Protocols for Reliable Lattice Parameter Values in Electron Pair Distribution Function Studies.” Journal of Applied Crystallography, vol. 48, no. 1, 2015, pp. 244–51, doi:10.1107/S1600576715000412.

Das, P. P., et al. “Pair Distribution Function Analysis of Amorphous Compounds Using TEM Electron Diffraction.” Acta Crystallographica Section A Foundations and Advances, vol. 71, no. a1, 2015, pp. s401–s401, https://doi.org/10.1107/S2053273315094036.

Khouchaf, L., et al. “Study of Amorphous Silica by Electron Energy Loss Spectroscopy and Electron Diffraction PDF.” European Microscopy Congress 2016: Proceedings, 2016, pp. 633–34, doi:10.1002/9783527808465.emc2016.6738. https://doi.org/10.1002/9783527808465.EMC2016.6738

Das, P. P., et al. ” Precession Diffraction for Reliable Electron Pair Distribution Function Analysis.” Acta Crystallographica Section A Foundations and Advances, 73(a2), C983–C983,2017, doi:10.1107/s2053273317085916.

Mu, X., et al. “Mapping Structure and Morphology of Amorphous Organic Thin Films by 4D-STEM Pair Distribution Function Analysis.” Microscopy, vol. 68, no. 4, 2019, pp. 301–09, doi:10.1093/jmicro/dfz015.

Hoque, M. M., et al. “Structural Analysis of Ligand-Protected Smaller Metallic Nanocrystals by Atomic Pair Distribution Function under Precession Electron Diffraction.” Journal of Physical Chemistry C, vol. 123, no. 32, American Chemical Society, 2019, pp. 19894–902, doi:10.1021/acs.jpcc.9b02901.

ASTAR- VDF (VIRTUAL DARK FIELD) –AMORPHOUS DETECTION

Rauch, E. F., et al. “Analyzing Dislocations with Virtual Dark Field Images Reconstructed from Electron Diffraction Patterns.” Microscopy and Microanalysis, vol. 20, no. 3, 2014, pp. 1456–57, doi:10.1017/S1431927614009015

APPLICATION NOTES

E-PDF Poster IUCr 2018 application note