NEW WEBINAR

ASTAR: Phase & Orientation mapping
at nm scale by 4D – SPED in TEM

Dr. Edgar Rauch & Dr. Muriel Veron,
University of Grenoble, SiMAP Laboratory CNRS France

December 2nd, 2020, 10:00-12:00 AM CET

The webinar will cover an introduction to Precession enhanced Phase & Orientation mapping for TEM (4D-Scanning Precession Electron Diffraction – 4D-SPED*). ASTAR system uses series of PED diffraction patterns of a scanning area of interest and a template matching approach to generate orientation and phase maps (up to 1-3 nm resolution).

Various materials as metals, alloys, minerals, nanostructures etc can be studied by ASTAR. Moreover, using common or interactive Virtual Bright Field images and Correlation Coefficient Map tools, superimposed secondary phases, hidden dislocations /defects and amorphous areas can be clearly highlighted locally in the material under studied at nm scale. Grain size distribution and texture analysis are further important tools to shed light to your materials local properties.Recent examples of ASTAR method will be presented. We hope you take this opportunity to learn about this advanced technique for TEM and visualize the wide range of exciting results obtained by 4D-SPED (ASTAR).

*4D SPED method is precession enhanced 4D-STEM technique

PRODUCTS & SOLUTIONS

TEM Orientation Imaging - ASTAR

ASTAR device uses novel TEM based orientation mapping technique to characterize any material up to 1 nm scale based on collection of precession electron diffraction patterns (PED).
In combination with TOPSPIN simultaneous orientation /phase /strain /STEM maps are possible

TEM Nanoscale Strain Mapping

Novel Automated Strain Mapping Solution for TEM/STEM (Patent pending) based on nanobeam precession diffraction patterns and STEM reference image acquisition. Precision up to 0.02% (200kV FEG) with spatial resolution < 2 nm (FEG TEM). In combination with TOPSPIN simultaneous orientation /phase /strain /STEM maps are possible.

3D Precession diffraction tomography

3D diffraction tomography in combination with DigiSTAR precession diffraction device enable automatic reconstruction of reciprocal cell of any material and solve any nanocrystalline structure.

Enhanced EELS & EDX spectroscopy

Beam Precession with DigiSTAR may enhance EELS & EDX signal reducing channeling effects. EELS quantification possible via TOPSPIN model based EELS quantification.

All IN ONE TOPSPIN Platform

TOPSPIN is a digital STEM, beam Precession Electron Diffraction analytical Experimental framework offering a suite of beam precession imaging and advanced analytical experiments.

Analysis of amorphous materials


Electron Pair Distribution Function (e-PDF) is an electron diffraction based technique that allows to analyze local order in amorphous and nanocrystalline materials from diffuse or ring ED patterns.

APPLICATIONS

NEWS

NanoMEGAS is partner of the European Network for Transmission Electron Microscopy with expertize in electron difffraction/crystallography techniques and TEM orientation imaging

Read more at : www.esteem3.eu

ESTEEM3 – Enabling Science and Technology through European Electron Microscopy – is an EU funded project for electron microscopy, which aims at providing access to the leading European state-of-the-art electron microscopy research infrastructure. Facilitating and extending transnational access services of the most powerful atomic scale characterization techniques in advanced electron microscopy research to a wide range of academic and industrial research communities for the analysis and engineering of novel materials in physical, chemical and biological sciences.

ESTEEM3’s objective is to deliver access to users coming from a wider range of disciplines. Transnational Access (TA) to ESTEEM3 centers is obtained through a transparent, simple peer review process based on merit and scientific priorities. Optimum service to users is supported by Networking Activities (NA) and Joint Research Activities (JRA), which address key issues such as specimen preparation, data interpretation, treatment and automation through theory and simulation, and standardization of protocols and methodologies.

EVENTS

APMC 12 Hyderabad India

3-7 February, 2020
Hyderabad, India

EBSD 2020

21-22 April, 2020
Sheffield, UK

XVII International Conference on EM

14-17 June, 2020
Wisla, Poland

 

NanoInnovation 2020

16-19 June, 2020
Rome, Italy

Microscopy & Microanalysis 2020

2-6 August, 2020
Milwaukee, Wisconsin, USA

 

European Microscopy EMC 2020

23-28 August, 2020
Copenhagen, Denmark

Electron Microscopy of
Nanostructures ELMINA2020
Conference

14-18 September, 2020
Beograd, Serbia

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