TEM Orientation Imaging - ASTAR

ASTAR device uses novel TEM based orientation mapping technique to characterize any material up to 1 nm scale based on collection of precession electron diffraction patterns (PED).
In combination with TOPSPIN simultaneous orientation /phase /strain /STEM maps are possible

TEM Nanoscale Strain Mapping

Novel Automated Strain Mapping Solution for TEM/STEM (Patent pending) based on nanobeam precession diffraction patterns and STEM reference image acquisition. Precision up to 0.02% (200kV FEG) with spatial resolution < 2 nm (FEG TEM). In combination with TOPSPIN simultaneous orientation /phase /strain /STEM maps are possible.

3D Precession diffraction tomography

3D diffraction tomography in combination with DigiSTAR precession diffraction device enable automatic reconstruction of reciprocal cell of any material and solve any nanocrystalline structure.

Enhanced EELS & EDX spectroscopy

Beam Precession with DigiSTAR may enhance EELS & EDX signal reducing channeling effects. EELS quantification possible via TOPSPIN model based EELS quantification.


TOPSPIN is a digital STEM, beam Precession Electron Diffraction analytical Experimental framework offering a suite of beam precession imaging and advanced analytical experiments.

Analysis of amorphous materials

Electron Pair Distribution Function (e-PDF) is an electron diffraction based technique that allows to analyze local order in amorphous and nanocrystalline materials from diffuse or ring ED patterns.



NanoMEGAS is partner of the European Network for Transmission Electron Microscopy with expertize in electron difffraction/crystallography techniques and TEM orientation imaging

Read more at :

ESTEEM3 – Enabling Science and Technology through European Electron Microscopy – is an EU funded project for electron microscopy, which aims at providing access to the leading European state-of-the-art electron microscopy research infrastructure. Facilitating and extending transnational access services of the most powerful atomic scale characterization techniques in advanced electron microscopy research to a wide range of academic and industrial research communities for the analysis and engineering of novel materials in physical, chemical and biological sciences.

ESTEEM3’s objective is to deliver access to users coming from a wider range of disciplines. Transnational Access (TA) to ESTEEM3 centers is obtained through a transparent, simple peer review process based on merit and scientific priorities. Optimum service to users is supported by Networking Activities (NA) and Joint Research Activities (JRA), which address key issues such as specimen preparation, data interpretation, treatment and automation through theory and simulation, and standardization of protocols and methodologies.


APMC 12 Hyderabad India

3-7 February, 2020
Hyderabad, India

EBSD 2020

21-22 April, 2020
Sheffield, UK

XVII International Conference on EM

14-17 June, 2020
Wisla, Poland


NanoInnovation 2020

16-19 June, 2020
Rome, Italy

Microscopy & Microanalysis 2020

2-6 August, 2020
Milwaukee, Wisconsin, USA


European Microscopy EMC 2020

23-28 August, 2020
Copenhagen, Denmark

Electron Microscopy of
Nanostructures ELMINA2020

14-18 September, 2020
Beograd, Serbia

To download the content of the Webinar, please fill out the following form: