ASTAR device uses novel TEM based orientation mapping technique to characterize any material up to 1 nm scale based on collection of precession electron diffraction patterns (PED).
In combination with TOPSPIN simultaneous orientation /phase /strain /STEM maps are possible

Novel Automated Strain Mapping Solution for TEM/STEM (Patent pending) based on nanobeam precession diffraction patterns and STEM reference image acquisition. Precision up to 0.02% (200kV FEG) with spatial resolution < 2 nm (FEG TEM). In combination with TOPSPIN simultaneous orientation /phase /strain /STEM maps are possible.

3D diffraction tomography in combination with DigiSTAR precession diffraction device enable automatic reconstruction of reciprocal cell of any material and solve any nanocrystalline structure.

Beam Precession with DigiSTAR may enhance EELS & EDX signal reducing channeling effects. EELS quantification possible via TOPSPIN model based EELS quantification.

TOPSPIN is a digital STEM, beam Precession Electron Diffraction analytical Experimental framework offering a suite of beam precession imaging and advanced analytical experiments.

Electron Pair Distribution Function (e-PDF) is an electron diffraction based technique that allows to analyze local order in amorphous and nanocrystalline materials from diffuse or ring ED patterns.

e-PDF data can be acquired with any TEM and can be applied to characterize amorphous semiconductors, glass and amorphous minerals , battery materials and in situ studies in liquids in environmental cells.

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