Advanced CCD and Direct Detection cameras
for high end 4D-STEM/SPED applications

 

Advanced  cameras as well as  latest  generation Direct Detection cameras specifically designed for TEM can be used for  ED pattern acquisition for optimized ASTAR ,  ADT 3D,   and  strain applications.Use of such advanced  cameras enable to  increase the speed of ED pattern collection (eg 1000 fps*)and consequently decrease acquisition time for each 4D-STEM/SPED map (speeding up the collection of data with a high-throughput and efficient setup).

Such  cameras  may  also allow to collect ED patterns at much lower  dose rates, making possible to  study beam sensitive materials  and collect ASTAR orientation and strain maps with very low noise while revealing fine structural details.

*The maximum frame rate, number of pixels, their related dynamic range and field-of-view are ultimately specified  by the camera provider. 

INTERFACE  WITH  ADVANCED CCD                              &      DIRECT DETECTION  CAMERAS

ED pattern acquisition for optimized ASTAR , ADT 3D and  strain applications can be obtained through special TOPSPIN module  for various CCD /DD cameras :  Merlin QD, Dectris QuadroGatan Orius , Gatan OneView

Precession Electron Diffraction using a Direct Electron Detector

4D-STEM / Precession Electron Diffraction & Pixelated Detectors

Observation of dynamic 3D motion of nanoparticles combined with 4D-STEM orientation and phase map in Liquid-Cell STEM microscopy

 3D Electron Diffraction / Micro-ED for Structural Characterization of beam sensitive API using Pixelated detectors

Searching for Api Polymorphs and solving their nanocrystal structures by Electro Diffraction Tomography

New Timepix Detector Enables Single Crystal Structure determination from Beams Sensitive Organic Materials using Electron Diffraction

ADT 3D  TOMOGRAPHY, ASTAR  , STRAIN, IN SITU  &  DD cameras

 

To download the content of the Webinar, please fill out the following form: