ASTAR 4D SPED LITERATURE :

    • Valery, A.,, et al. "Dealing With Multiple Grains in TEM Lamellae Thickness for Microstructure Analysis Using Scanning Precession Electron Diffraction." Microscopy and Microanalysis, vol. 21, no. S3, pp. 1243–44, 2015, doi: 10.1017/s143192761500700x

    • Eggeman, A. S.,, et al. "Scanning Precession Electron Tomography for Three-Dimensional Nanoscale Orientation Imaging and Crystallographic Analysis." Nature Communications, vol. 6, Nature Publishing Group, pp. 1–7, 2015, doi: 10.1038/ncomms8267

    • DN Johnstone, et al. "Crystallographic mapping in engineering alloys by scanning precession electron diffraction", 2016, doi: https://onlinelibrary.wiley.com/doi/abs/10.1002/9783527808465.EMC2016.6041

    • Sunde, J. K.,, et al. "Phase Mapping of 2xxx-Series Aluminium Alloys by Scanning Precession Electron Diffraction.", 2016, doi: 10.1002/9783527808465.EMC2016.5248

    • Ortega, E.,, et al. "Structural Damage Reduction in Protected Gold Clusters by Electron Diffraction Methods." Advanced Structural and Chemical Imaging, vol. 2, no. 1, Springer International Publishing, 2016, doi: 10.1186/s40679-016-0026-x

    • Bruma, A.,, et al. "Structure Determination of Superatom Metallic Clusters Using Rapid Scanning Electron Diffraction." Journal of Physical Chemistry C, vol. 120, no. 3, pp.1902–08, 2016, doi: 10.1021/acs.jpcc.5b09524

    • Kobler, A.,, et al. "Challenges in Quantitative Crystallographic Characterization of 3D Thin Films by ACOM-TEM." Ultramicroscopy, vol. 173, Elsevier, pp. 84–94, 2016, doi: 10.1016/j.ultramic.2016.07.007

    • Valery, A.,, et al. "Retrieving Overlapping Crystals Information from TEM Nano-Beam Electron Diffraction Patterns." Journal of Microscopy, vol. 268, no. 2, pp. 208–18, 2017, doi: 10.1111/jmi.12599

    • Johnstone, D. N.,, et al. "The Microstructure of Pharmaceutical Materials Revealed by Scanning Electron Diffraction." Microscopy and Microanalysis, vol. 23, no. S1, pp.1192–93, 2017, doi: 10.1017/s1431927617006626

    • HW Ånes, et al. "Crystal phase mapping by scanning precession electron diffraction and machine learning decomposition", 2018, doi: DOI: https://doi.org/10.1017/S1431927618003422

    • Kobler, A.,, et al. "Towards 3D Crystal Orientation Reconstruction Using Automated Crystal Orientation Mapping Transmission Electron Microscopy (ACOM-TEM)." Beilstein Journal of Nanotechnology, vol. 9, no. 1, pp. 602–07, 2018, doi: 10.3762/bjnano.9.56

    • HW Ånes, et al. "In-situ observations of dislocation recovery and low angle boundary formation in deformed aluminium", 2019, doi: https://iopscience.iop.org/article/10.1088/1742-6596/1270/1/012010/meta

    • Nord, M.,, et al. "Fast Pixelated Detectors in Scanning Transmission Electron Microscopy. Part I: Data Acquisition, Live Processing and Storage", 2019, doi: http://arxiv.org/abs/1911.11560

    • Rauch, E. F.,, et al. "Methods for Orientation and Phase Identification of Nano-Sized Embedded Secondary Phase Particles by 4D Scanning Precession Electron Diffraction." Acta Crystallographica Section B: Structural Science, Crystal Engineering and Materials, vol. 75, pp. 505–11, 2019, doi: 10.1107/S2052520619007583

    • Christiansen, E.,, et al. "Nano-Scale Characterisation of Sheared _" Precipitates in a Deformed Al-Mg-Si Alloy." Scientific Reports, vol. 9, no. 1, pp. 1–11, 2019, doi: 10.1038/s41598-019-53772-4

    • Rauch, E. F.,, et al. "Revealing Embedded Crystals through Their Diffracting Signals in Transmission Electron Microscopy." Microscopy and Microanalysis, vol. 25, no. S2,pp.1922–23, 2019, doi: 10.1017/s1431927619010341

    • Eggeman, A. S., et al. "Scanning Transmission Electron Diffraction Methods." Acta Crystallographica Section B: Structural Science, Crystal Engineering and Materials, vol. 75, International Union of Crystallography, pp. 475–84, 2019, doi: 10.1107/S2052520619006723

    • Martineau, B. H.,, et al. "Unsupervised Machine Learning Applied to Scanning Precession Electron Diffraction Data." Advanced Structural and Chemical Imaging, vol. 5, no. 1, Springer International Publishing, 2019, doi: 10.1186/s40679-019-0063-3

    • Alexander Stuart Eggeman, et al. "Scanning transmission electron diffraction methods", Acta Cryst. . B75, 475–484, 2019, doi: 10.1107/S2052520619006723

    • I MacLaren, et al. "Detectors—The ongoing revolution in scanning transmission electron microscopy and why this important to material characterization", 2020, doi: https://aip.scitation.org/doi/abs/10.1063/5.0026992

    • GW Paterson, et al. "Fast Pixelated Detectors in Scanning Transmission Electron Microscopy. Part II: Post-Acquisition Data Processing, Visualization, and Structural Characterization", 2020, doi: https://www.cambridge.org/core/journals/microscopy-and-microanalysis/article/fast-pixelated-detectors-in-scanning-transmission-electron-microscopy-part-ii-postacquisition-data-processing-visualization-and-structural-characterization/6B475CC18BACF288548A414344377D34

    • H Zhao, et al. "Geometrical constraints on the bending deformation of Penta-twinned silver nanowires", 2020, doi: https://doi.org/10.1016/j.actamat.2019.11.058

    • Zhao, H.,, et al. "Geometrical Constraints on the Bending Deformation of Penta-Twinned Silver Nanowires." Acta Materialia, vol. 185, Elsevier Ltd, pp. 110–18, 2020, doi: 10.1016/j.actamat.2019.11.058

    • Ian MacLaren, et al. "A Comparison of a Direct Electron Detector and a High-Speed Video Camera for a Scanning Precession Electron Diffraction Phase and Orientation Mapping", Microscopy and Microanalysis , 1–7, 2020, doi: 10.1017/S143192762002441

    • Shane J. McCartan, et al. "Correlative chemical and structural nano-characterization of a pseudo-binary 0.75Bi (Fe0.97Ti0.03)O3–0.25BaTiO3 ceramic", 2020, doi: 10.1111/JACE.17599

    • Loïc Henry, et al. "Studying phase change memory devices by coupling scanning precession electron diffraction and energy dispersive X-ray analysis", Acta Materialia 201 72-78, 2020, doi: 10.1016/j.actamat.2020.09.033

    • J Jeong, et al. "Automated crystal orientation mapping by precession electron diffraction assisted four-dimensional scanning transmission electron microscopy (4D-STEM) using a …", 2021, doi: https://arxiv.org/abs/2102.09711

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