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ASTAR 4D SPED LITERATURE
Valery, A.,, et al. "Dealing With Multiple Grains in TEM Lamellae Thickness for Microstructure Analysis Using Scanning Precession Electron Diffraction." Microscopy and Microanalysis, vol. 21, no. S3, pp. 1243–44, 2015, doi: 10.1017/s143192761500700x
Eggeman, A. S.,, et al. "Scanning Precession Electron Tomography for Three-Dimensional Nanoscale Orientation Imaging and Crystallographic Analysis." Nature Communications, vol. 6, Nature Publishing Group, pp. 1–7, 2015, doi: 10.1038/ncomms8267
DN Johnstone, et al. "Crystallographic mapping in engineering alloys by scanning precession electron diffraction", 2016, doi: https://onlinelibrary.wiley.com/doi/abs/10.1002/9783527808465.EMC2016.6041
Sunde, J. K.,, et al. "Phase Mapping of 2xxx-Series Aluminium Alloys by Scanning Precession Electron Diffraction.", 2016, doi: 10.1002/9783527808465.EMC2016.5248
Ortega, E.,, et al. "Structural Damage Reduction in Protected Gold Clusters by Electron Diffraction Methods." Advanced Structural and Chemical Imaging, vol. 2, no. 1, Springer International Publishing, 2016, doi: 10.1186/s40679-016-0026-x
Bruma, A.,, et al. "Structure Determination of Superatom Metallic Clusters Using Rapid Scanning Electron Diffraction." Journal of Physical Chemistry C, vol. 120, no. 3, pp.1902–08, 2016, doi: 10.1021/acs.jpcc.5b09524
Kobler, A.,, et al. "Challenges in Quantitative Crystallographic Characterization of 3D Thin Films by ACOM-TEM." Ultramicroscopy, vol. 173, Elsevier, pp. 84–94, 2016, doi: 10.1016/j.ultramic.2016.07.007
Valery, A.,, et al. "Retrieving Overlapping Crystals Information from TEM Nano-Beam Electron Diffraction Patterns." Journal of Microscopy, vol. 268, no. 2, pp. 208–18, 2017, doi: 10.1111/jmi.12599
Johnstone, D. N.,, et al. "The Microstructure of Pharmaceutical Materials Revealed by Scanning Electron Diffraction." Microscopy and Microanalysis, vol. 23, no. S1, pp.1192–93, 2017, doi: 10.1017/s1431927617006626
HW Ånes, et al. "Crystal phase mapping by scanning precession electron diffraction and machine learning decomposition", 2018, doi: DOI: https://doi.org/10.1017/S1431927618003422
Kobler, A.,, et al. "Towards 3D Crystal Orientation Reconstruction Using Automated Crystal Orientation Mapping Transmission Electron Microscopy (ACOM-TEM)." Beilstein Journal of Nanotechnology, vol. 9, no. 1, pp. 602–07, 2018, doi: 10.3762/bjnano.9.56
HW Ånes, et al. "In-situ observations of dislocation recovery and low angle boundary formation in deformed aluminium", 2019, doi: https://iopscience.iop.org/article/10.1088/1742-6596/1270/1/012010/meta
Nord, M.,, et al. "Fast Pixelated Detectors in Scanning Transmission Electron Microscopy. Part I: Data Acquisition, Live Processing and Storage", 2019, doi: http://arxiv.org/abs/1911.11560
Rauch, E. F.,, et al. "Methods for Orientation and Phase Identification of Nano-Sized Embedded Secondary Phase Particles by 4D Scanning Precession Electron Diffraction." Acta Crystallographica Section B: Structural Science, Crystal Engineering and Materials, vol. 75, pp. 505–11, 2019, doi: 10.1107/S2052520619007583
Christiansen, E.,, et al. "Nano-Scale Characterisation of Sheared _" Precipitates in a Deformed Al-Mg-Si Alloy." Scientific Reports, vol. 9, no. 1, pp. 1–11, 2019, doi: 10.1038/s41598-019-53772-4
Rauch, E. F.,, et al. "Revealing Embedded Crystals through Their Diffracting Signals in Transmission Electron Microscopy." Microscopy and Microanalysis, vol. 25, no. S2,pp.1922–23, 2019, doi: 10.1017/s1431927619010341
Eggeman, A. S., et al. "Scanning Transmission Electron Diffraction Methods." Acta Crystallographica Section B: Structural Science, Crystal Engineering and Materials, vol. 75, International Union of Crystallography, pp. 475–84, 2019, doi: 10.1107/S2052520619006723
Martineau, B. H.,, et al. "Unsupervised Machine Learning Applied to Scanning Precession Electron Diffraction Data." Advanced Structural and Chemical Imaging, vol. 5, no. 1, Springer International Publishing, 2019, doi: 10.1186/s40679-019-0063-3
Alexander Stuart Eggeman, et al. "Scanning transmission electron diffraction methods", Acta Cryst. . B75, 475–484, 2019, doi: 10.1107/S2052520619006723
I MacLaren, et al. "Detectors—The ongoing revolution in scanning transmission electron microscopy and why this important to material characterization", 2020, doi: https://aip.scitation.org/doi/abs/10.1063/5.0026992
GW Paterson, et al. "Fast Pixelated Detectors in Scanning Transmission Electron Microscopy. Part II: Post-Acquisition Data Processing, Visualization, and Structural Characterization", 2020, doi: https://www.cambridge.org/core/journals/microscopy-and-microanalysis/article/fast-pixelated-detectors-in-scanning-transmission-electron-microscopy-part-ii-postacquisition-data-processing-visualization-and-structural-characterization/6B475CC18BACF288548A414344377D34
H Zhao, et al. "Geometrical constraints on the bending deformation of Penta-twinned silver nanowires", 2020, doi: https://doi.org/10.1016/j.actamat.2019.11.058
Zhao, H.,, et al. "Geometrical Constraints on the Bending Deformation of Penta-Twinned Silver Nanowires." Acta Materialia, vol. 185, Elsevier Ltd, pp. 110–18, 2020, doi: 10.1016/j.actamat.2019.11.058
Ian MacLaren, et al. "A Comparison of a Direct Electron Detector and a High-Speed Video Camera for a Scanning Precession Electron Diffraction Phase and Orientation Mapping", Microscopy and Microanalysis , 1–7, 2020, doi: 10.1017/S143192762002441
Shane J. McCartan, et al. "Correlative chemical and structural nano-characterization of a pseudo-binary 0.75Bi (Fe0.97Ti0.03)O3–0.25BaTiO3 ceramic", 2020, doi: 10.1111/JACE.17599
Loïc Henry, et al. "Studying phase change memory devices by coupling scanning precession electron diffraction and energy dispersive X-ray analysis", Acta Materialia 201 72-78, 2020, doi: 10.1016/j.actamat.2020.09.033
J Jeong, et al. "Automated crystal orientation mapping by precession electron diffraction assisted four-dimensional scanning transmission electron microscopy (4D-STEM) using a …", 2021, doi: https://arxiv.org/abs/2102.09711