Rauch, E. F.,, et al. "Coupled Microstructural Observations and Local Texture Measurements with an Automated Crystallographic Orientation Mapping Tool Attached to a Tem." Materialwissenschaft Und Werkstofftechnik, vol. 36, no. 10, pp.552–56, 2005, doi: 10.1002/mawe.200500923

Rauch, E. F.,, et al. "Orientation Maps Derived from TEM Diffraction Patterns Collected with an External CCD Camera." Materials Science Forum, vol. 495–497, pp. 197–202, 2005, doi: 10.4028/www.scientific.net/msf.495-497.197

Rauch, E. F.,, et al. "Rapid Spot Diffraction Patterns Identification through Template Matching." Archives of Metallurgy and Materials, vol. 50, no. 1, pp. 87–99, Id. YADDA, 2005, doi: bwmeta1.element.baztech-article-BSW3-0014-0019

Rauch, E. F.,, et al. "Comments on ‘on the Reliability of Fully Automatic Indexing of Electron Diffraction Patterns Obtained in a Transmission Electron Microscope’ by Morawiec & Bouzy ." Journal of Applied Crystallography, vol. 39, no. 1, pp.104–05, 2006, doi: 10.1107/S0021889805033157

Rauch, E. F.,, et al. "Automatic Crystal Orientation and Phase Mapping in TEM by Precession Diffraction." Microscopy and Analysis, vol. 22, no. 6, pp. S5–8, 2008, doi: http://www.microscopy-analysis.com/sites/default/files/magazine_pdfs/mag 2008_November_Rauch.pdf

Rouvimov, S.,, et al. "Automated Crystal Orientation and Phase Mapping of Iron-Oxide Nanocrystals in a Transmission Electron Microscope." International Semiconductor Device Research Symposium, ISDRS ’09, pp. 2–5, 2009, doi: 10.1109/ISDRS.2009.5378049

Moeck, P.,, et al. "Structural Fingerprinting of Nanocrystals: Advantages of Precession Electron Diffraction, Automated Crystallite Orientation and Phase Maps." Materials Research Society Symposium Proceedings, vol. 1184, pp. 49–60, 2009, doi: 10.1557/proc-1184-gg03-07

Rauch, E. F.,, et al. "Automated Nanocrystal Orientation and Phase Mapping in the Transmission Electron Microscope on the Basis of Precession Electron Diffraction." Zeitschrift Fur Kristallographie, vol. 225, no. 2–3, pp. 103–09, 2010, doi: 10.1524/zkri.2010.1205

Rouvimov, S.,, et al. "Crystallographic Characterization of Polycrystalline Materials: High Resolution Automated Crystallite Orientation & Phase Mapping and Precession Electron Diffraction Ring Patterns." Microscopy and Microanalysis, vol. 16, no. 2, pp. 768–769, 2010, doi: 10.1017/s1431927610059052

Rauch, E. F., and M. Véron., et al. "Improving Angular Resolution of the Crystal Orientation Determined with Spot Diffraction Patterns." Microscopy and Microanalysis, vol. 16, no. S2, pp. 770–71, 2010, doi: 10.1017/s1431927610059593

Portillo, J.,, et al. "Precession Electron Diffraction Assisted Orientation Mapping in the Transmission Electron Microscope." Materials Science Forum, vol. 644, pp. 1–7, 2010, doi: 10.4028/www.scientific.net/MSF.644.1

Rouvimov, S.,, et al. "Automated Crystallite Orientation & Phase Mapping in the TEM: Diffraction Contrast in Virtual Bright/Dark Field Images of Polycrystalline Copper." Microscopy and Microanalysis, vol. 17, no. S2, pp. 1098–99, 2011, doi: 10.1017/s1431927611006362

Pavia, G.,, et al. "Crystal Orientation Mapping via STEM/NBD: Improved Quality with Precession Electron Diffraction and Energy Filtering." Microscopy and Microanalysis, vol. 17, no. S2, pp. 1074–75, 2011, doi: 10.1017/s1431927611006246

Moeck, P.,, et al. "High Spatial Resolution Semi-Automatic Crystallite Orientation and Phase Mapping of Nanocrystals in Transmission Electron Microscopes." Crystal Research and Technology, vol. 46, no. 6, pp. 589–606, 2011, doi: 10.1002/crat.201000676

Veron, M.,, et al. "Novel Electron Diffraction Technique for Texture Analysis (Orientation & Phase Mapping) of Organic Nanocrystals." PXRD 10 Workshop for Pharmaceutical Applications, 2011, doi:

Moeck, P.,, et al. "Precession Electron Diffraction & Automated Crystallite Orientation/Phase Mapping in a Transmission Electron Microscope." Proceedings of the IEEE Conference on Nanotechnology, pp. 754–59, 2011, doi: 10.1109/NANO.2011.6144300

S Zaefferer - Crystal Research and Technology, et al. "A critical review of orientation microscopy in SEM and TEM", 2011, doi: https://onlinelibrary.wiley.com/doi/abs/10.1002/crat.201100125

G Benner, et al. "Nano beam diffraction and precession in an energy filtered CS corrected transmission electron microscope", 2011, doi: https://onlinelibrary.wiley.com/doi/abs/10.1002/crat.201000582

P Moeck, et al. "Precession electron diffraction & automated crystallite orientation/phase mapping in a transmission electron microscope", 2011, doi: https://ieeexplore.ieee.org/abstract/document/6144300/

Darbal, A. D.,, et al. "Nanoscale Automated Phase and Orientation Mapping in the TEM." Microscopy Today, vol. 20, no. 6, pp. 38–42, 2012, doi: 10.1017/s1551929512000818

Nicolopoulos, S.,, et al. "Novel EBSD-TEM like Technique: Texture Analysis, Orientation and Phase Maps on Nanostructured Materials." EMAS – 10th Regional Workshop on Electron Probe Microanalysis Today – Practical Aspects, 2012, doi: http://www.lem3.fr/beausir/Benoit/papers/NRV12.pdf

Rauch, E. F.,, et al. "Orientation and Phase Mapping in TEM Microscopy (EBSD-TEM like): Applications to Materials Science." Solid State Phenomena, vol. 186, pp.13–15, 2012, doi: 10.4028/www.scientific.net/ssp.186.13

W Neumann, et al. "Methods of electron crystallography as tools for materials analysis", 2012, doi: https://www.scientific.net/ssp.186.1

LD Marks - Uniting Electron Crystallography and Powder …, et al. "Models for Precession Electron Diffraction", 2012, doi: https://link.springer.com/chapter/10.1007/978-94-007-5580-2_26

AS Eggeman, et al. "Precession electron diffraction", 2012, doi: https://www.sciencedirect.com/science/article/pii/B9780123943965000014

J Portillo i Serra - Capítol del llibre: Handbook of instrumental …, et al. "Precession Electron Diffraction in the Transmission Electron Microscope: electron crystallography and orientational mapping", 2012, doi: http://diposit.ub.edu/dspace/handle/2445/32145

Viladot, D.,, et al. "Orientation and Phase Mapping in the Transmission Electron Microscope Using Precession-Assisted Diffraction Spot Recognition: State-of-the-Art Results." Journal of Microscopy, vol. 252, no. 1, pp. 23–34, 2013, doi: 10.1111/jmi.12065

Rauch, E. F.,, et al. "Solving the 180 Degree Orientation Ambiguity Related to Spot Diffraction Patterns in Transmission Electron Microscopy." Microscopy and Microanalysis, vol. 19, no. S2, pp. 324–25, 2013, doi: 10.1017/s1431927613003619

D Viladot, et al. "Orientation and phase mapping in the transmission electron microscope using precession‐assisted diffraction spot recognition: state‐of‐the‐art results", 2013, doi: https://onlinelibrary.wiley.com/doi/abs/10.1111/jmi.12065

Brons, J. G.,, et al. "Orientation Mapping via Precession-Enhanced Electron Diffraction and Its Applications in Materials Science." Jom, vol. 66, no. 1, pp. 165–70, 2014, doi: 10.1007/s11837-013-0799-5

Rauch, E. F.,, et al. "Automated Crystal Orientation and Phase Mapping in TEM." Materials Characterization, vol. 98, Elsevier Inc., pp. 1–9, 2014, doi: 10.1016/j.matchar.2014.08.010

EF Rauch, et al. "Automated crystal orientation and phase mapping in TEM", 2014, doi: https://doi.org/10.1016/j.matchar.2014.08.010

Rollett, A. D.,, et al. "Orientation Mapping." Physical Metallurgy: Fifth Edition, Fifth Edition, vol. 1, Elsevier B.V., 2014, doi: 10.1016/B978-0-444-53770-6.00011-3

K Barmak - Metallic Films for Electronic, et al. "Crystal orientation mapping in scanning and transmission electron microscopes", 2014, doi: DOI:10.1533/9780857096296.1.39

S Suwas, et al. "Experimental Determination of Texture", 2014, doi: DOI: 10.1007/978-1-4471-6314-5_3

X Liu, et al. "Interfacial orientation and misorientation relationships in nanolamellar Cu/Nb composites using transmission-electron-microscope-based orientation and phase …", 2014, doi: https://www.sciencedirect.com/science/article/pii/S1359645413008094

B Haas, et al. "Microstructural characterization of organic heterostructures by (transmission) electron microscopy", 2014, doi: https://pubs.acs.org/doi/abs/10.1021/cg5002896

JG Brons, et al. "Orientation mapping via precession-enhanced electron diffraction and its applications in materials science", 2014, doi: https://link.springer.com/article/10.1007/s11837-013-0799-5

Kiss, Á. K.,, et al. "A Tool for Local Thickness Determination and Grain Boundary Characterization by CTEM and HRTEM Techniques." Microscopy and Microanalysis, vol. 21, no. 2, pp. 422–35, 2015, doi: 10.1017/S1431927615000112

Ruiz-Zepeda, F.,, et al. "Electron Diffraction and Crystal Orientation Phase Mapping Under Scanning Transmission Electron Microscopy." Advanced Transmission Electron Microscopy: Applications to Nanomaterials, pp. 31–58, 2015, doi: 10.1007/978-3-319-15177-9_2

F Ruiz-Zepeda, et al. "Electron diffraction and crystal orientation phase mapping under scanning transmission electron microscopy", 2015, doi: https://link.springer.com/chapter/10.1007/978-3-319-15177-9_2

CY Kim, et al. "Three-Dimensional Automated Crystal Orientation and Phase Mapping Analysis of Epitaxially Grown Thin Film Interfaces by Using Transmission Electron Microscopy", 2015, doi: http://www.appmicro.org/journal/view.html?uid=150&page=&sort=book_Seq&scale=&all_k=&s_t=&s_a=&s_k=&s_v=&s_n=&spage=183&pn=vol&year=2015&vmd=AR

Rauch, E. F., and M. Véron., et al. "Crystal Orientation Angular Resolution with Precession Electron Diffraction." Microscopy and Microanalysis, vol. 22, no. S3, pp. 500–01, 2016, doi: 10.1017/s1431927616003354

Weiss, J.,, et al. "Microstructure Characterization of Nanoscale Materials and Interconnects." Metrology and Diagnostic Techniques for Nanoelectronics, vol. 8, p. 447-492, 2016, doi: ISBN-13: 978-9814745086

Mu, X.,, et al. "Radial Distribution Function Imaging by STEM Diffraction: Phase Mapping and Analysis of Heterogeneous Nanostructured Glasses." Ultramicroscopy, vol. 168, Elsevier, pp. 1–6, 2016, doi: 10.1016/j.ultramic.2016.05.009

Rauch, E.,, et al. "Reflection Profile and Angular Resolution with Precession Electron Diffraction." European Microscopy Congress : Proceedings, vol. 98, no. 1, pp.665–66, 2016, doi: 10.1002/EMC2016.0873

Barnard, J. S.,, et al. "High-Resolution Scanning Precession Electron Diffraction: Alignment and Spatial Resolution." Ultramicroscopy, vol. 174, no. December Elsevier, pp. 79–88, 2016, doi: 10.1016/j.ultramic.2016.12.018

A Mussi, et al. "Transmission electron microscopy of dislocations in cementite deformed at high pressure and high temperature", 2016, doi: https://www.tandfonline.com/doi/abs/10.1080/14786435.2016.1177670

E Izadi - 2017 - search.proquest.com, et al. "Investigating the Mechanical Behavior and Deformation Mechanisms of Ultrafinegrained Metal Films Using Ex-situ and In-situ TEM Techniques", 2017, doi: https://search.proquest.com/openview/3cf84e672bd6728a0db0680c95936eeb/1?pq-origsite=gscholar&cbl=18750

Nikolopoulos, S.,, et al. "Random Electron Diffraction Tomography for Structure Analysis of Pharmaceuticals." Acta Crystallographica, A73,C980, 2017, doi: https://doi.org/10.1107/s2053273317085941

Valery, A.,, et al. "TEM Illumination Settings Study for Optimum Spatial Resolution and Indexing Reliability in Crystal Orientation Mappings." Micron, vol. 92, Elsevier Ltd, pp. 43–50, 2017, doi: 10.1016/j.micron.2016.11.003

A Valery - 2017 - tel.archives-ouvertes.fr, et al. "Microtexture characterization by Automated Crystal Orientation Mapping in TEM for the development of advanced technologies in microelectronics", 2017, doi: https://tel.archives-ouvertes.fr/tel-01688218/

R Ruffilli - 2017 - thesesups.ups-tlse.fr, et al. "Modes de fatigue des métallisations à base d'aluminium dans les composants MOSFET de puissance", 2017, doi: http://thesesups.ups-tlse.fr/3800/

A Valery, et al. "Retrieving overlapping crystals information from TEM nano‐beam electron diffraction patterns", 2017, doi: https://onlinelibrary.wiley.com/doi/abs/10.1111/jmi.12599

A Valery, et al. "TEM illumination settings study for optimum spatial resolution and indexing reliability in crystal orientation mappings", 2017, doi: https://www.sciencedirect.com/science/article/pii/S0968432816302360

T Cossuet - 2018 - tel.archives-ouvertes.fr, et al. "Problématique de la polarité dans les nanofils de ZnO localisés, et hétérostructures reliées pour l'opto-électronique", 2018, doi: https://tel.archives-ouvertes.fr/tel-02275791/

S Plana-Ruiz, et al. "Quasi-parallel precession diffraction: Alignment method for scanning transmission electron microscopes", 2018, doi: https://www.sciencedirect.com/science/article/pii/S0304399117301717

V Singh, et al. "Microstructural Characterization by Automated Crystal Orientation and Phase Mapping by Precession Electron Diffraction in TEM: Application to Hot Deformation of a γ …", 2019, doi: https://www.cambridge.org/core/journals/microscopy-and-microanalysis/article/microstructural-characterization-by-automated-crystal-orientation-and-phase-mapping-by-precession-electron-diffraction-in-tem-application-to-hot-deformation-of-a-tialbased-alloy/90C023EB5EF4DD7B79FBEED1666213FE

AS Eggeman - Acta Crystallographica Section B: Structural Science …, et al. "Scanning transmission electron diffraction methods", 2019, doi: https://scripts.iucr.org/cgi-bin/paper?je5010

M Sivakumar, et al. "Selected Area Electron Diffraction, a technique for determination of crystallographic texture in nanocrystalline powder particle of Alloy 617 ODS and comparison with …", 2019, doi: https://www.sciencedirect.com/science/article/pii/S1044580319319746

JE Nathaniel II, et al. "Toward high-throughput defect density quantification: A comparison of techniques for irradiated samples", 2019, doi: https://www.sciencedirect.com/science/article/pii/S0304399119300270

I MacLaren, et al. "A comparison of a direct electron detector and a high-speed video camera for a scanning precession electron diffraction phase and orientation mapping", 2020, doi: https://www.cambridge.org/core/journals/microscopy-and-microanalysis/article/comparison-of-a-direct-electron-detector-and-a-highspeed-video-camera-for-a-scanning-precession-electron-diffraction-phase-and-orientation-mapping/550A9063C10815FE06CB3442F0E5A632

JD Sugar, et al. "Comparison of Orientation Mapping in SEM and TEM", 2020, doi: DOI: https://doi.org/10.1017/S1431927620001671

ST Hu - 2020 - repositories.lib.utexas.edu, et al. "Scaling effects on microstructure and resistivity for Cu and Co nano-interconnects", 2020, doi: https://repositories.lib.utexas.edu/handle/2152/85600

J Jeong, et al. "Crystallographic Orientation Analysis of Nanocrystalline Tungsten Thin Film Using TEM Precession Electron Diffraction and SEM Transmission Kikuchi Diffraction", 2021, doi: DOI: https://doi.org/10.1017/S1431927621000027

N Cautaerts, et al. "Investigation of the orientation relationship between nano-sized G-phase precipitates and austenite with scanning nano-beam electron diffraction using a …", 2021, doi: https://www.sciencedirect.com/science/article/pii/S1359646221002104

T Zhou, et al. "On the role of transmission electron microscopy for precipitation analysis in metallic materials", 2021, doi: https://www.tandfonline.com/doi/abs/10.1080/10408436.2021.1941751

L Morales-Rivas, et al. "Parent austenite reconstruction tolerant to 180° ambiguity: Application to a very-high-cycle-fatigue-tested bearing-steel", 2021, doi: https://www.sciencedirect.com/science/article/pii/S1044580321003752