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ASTAR THIN FILMS, MULTILAYERS, NANOWIRES LITERATURE
Rauch, E.,, et al. "Automated Crystal Orientation and Phase Mapping for Thin Film Applications by Transmission Electron Microscopy." Microscopy and Microanalysis, vol. 17, no. S2, pp. 1086–87, 2011, doi: 10.1017/s1431927611006301
Carpenter, J. S.,, et al. "A Comparison of Texture Results Obtained Using Precession Electron Diffraction and Neutron Diffraction Methods at Diminishing Length Scales in Ordered Bimetallic Nanolamellar Composites." Scripta Materialia, vol. 67, no. 4, pp. 336–39, 2012, doi: 10.1016/j.scriptamat.2012.05.018
Wang, B.,, et al. "Advanced TEM Investigation of the Plasticity Mechanisms in Nanocrystalline Freestanding Palladium Films with Nanoscale Twins." International Journal of Plasticity, vol. 37, no. Elsevier Ltd, pp. 140–56, 2012, doi: 10.1016/j.ijplas.2012.04.003
Rajasekhara, S.,, et al. "Evidence of Metastable Hcp Phase Grains in As-Deposited Nanocrystalline Nickel Films." Scripta Materialia, vol. 67, no. 2, Acta Materialia Inc.,pp.189–92, 2012, doi: 10.1016/j.scriptamat.2012.04.014
Mohseni, H.,, et al. "Nanocrystalline Orientation and Phase Mapping of Textured Coatings Revealed by Precession Electron Diffraction." Nanomaterials and Energy, vol. 1, no. 6, pp. 318–23, 2012, doi: 10.1680/nme.12.00023
H Kirmse, et al. "Angular sensitivity of crystallographic orientation analysis by scanning nanobeam electron diffraction", 2012, doi: http://www.emc2012.org.uk/documents/Abstracts/Abstracts/EMC2012_1129.pdf
S Estradé, et al. "Assessment of misorientation in metallic and semiconducting nanowires using precession electron diffraction", 2012, doi: https://doi.org/10.1016/j.micron.2012.03.003
S Rajasekhara, et al. "Evidence of metastable hcp phase grains in as-deposited nanocrystalline nickel films", 2012, doi: https://www.sciencedirect.com/science/article/pii/S1359646212002552
F Mompiou, et al. "In situ TEM observation of grain annihilation in tricrystalline aluminum films", 2012, doi: https://www.sciencedirect.com/science/article/pii/S1359645411008755
H Mohseni, et al. "Nanocrystalline orientation and phase mapping of textured coatings revealed by precession electron diffraction", 2012, doi: https://www.icevirtuallibrary.com/doi/abs/10.1680/nme.12.00023
Han, W.,, et al. "Design of Radiation Tolerant Materials via Interface Engineering." Advanced Materials, vol. 25, no. 48, pp. 6975–79, 2013, doi: 10.1002/adma.201303400
Lohmiller, J.,, et al. "Differentiation of Deformation Modes in Nanocrystalline Pd Films Inferred from Peak Asymmetry Evolution Using in Situ X-Ray Diffraction." Physical Review Letters, vol. 110, no. 6, pp. 1–5, 2013, doi: 10.1103/PhysRevLett.110.066101
Amin-Ahmadi, B.,, et al. "Effect of Deposition Rate on the Microstructure of Electron Beam Evaporated Nanocrystalline Palladium Thin Films." Thin Solid Films, vol. 539, no. Elsevier B.V., pp. 145–50, 2013, doi: 10.1016/j.tsf.2013.05.083
Polyakov, M. N.,, et al. "Microstructural Variations in Cu/Nb and Al/Nb Nanometallic Multilayers." Applied Physics Letters, vol. 102, no. 24,, 2013, doi: 10.1063/1.4811822
Lohmiller, J.,, et al. "The Effect of Solute Segregation on Strain Localization in Nanocrystalline Thin Films: Dislocation Glide vs. Grain-Boundary Mediated Plasticity." Applied Physics Letters, vol. 102, no. 24,, 2013, doi: 10.1063/1.4811743
Lagrange, T.,, et al. "Topological View of the Thermal Stability of Nanotwinned Copper." Applied Physics Letters, vol. 102, no. 1,, 2013, doi: 10.1063/1.4772589
RE Sah, et al. "Crystallographic texture of submicron thin aluminum nitride films on molybdenum electrode for suspended micro and nanosystems", 2013, doi: DOI:10.1149/2.001305jss
AB Aebersold, et al. "Quantitative, 3D Studies of the Evolution of Grain Size and Orientation in Nano-grained, Polycrystalline Thin-Films", 2013, doi: https://www.cambridge.org/core/journals/microscopy-and-microanalysis/article/quantitative-3d-studies-of-the-evolution-of-grain-size-and-orientation-in-nano-grained-polycrystalline-thinfilms/A2752B53F9D6300C1AEAAE4CC6F081B6
SB Lee, et al. "Texture evolution of abnormal grains with post-deposition annealing temperature in nanocrystalline Cu thin films", 2013, doi: https://link.springer.com/content/pdf/10.1007/s11661-012-1542-5.pdf
J Lohmiller, et al. "The effect of solute segregation on strain localization in nanocrystalline thin films: Dislocation glide vs. grain-boundary mediated plasticity", 2013, doi: https://aip.scitation.org/doi/abs/10.1063/1.4811743
T LaGrange, et al. "Topological view of the thermal stability of nanotwinned copper", 2013, doi: https://aip.scitation.org/doi/abs/10.1063/1.4772589
S Rajasekhara, et al. "Microstructural evolution of nanocrystalline nickel thin films due to high-energy heavy-ion irradiation", 2013A312, doi: https://aip.scitation.org/doi/abs/10.1063/1.4802404
Brons, J. G.,, et al. "Abnormalities Associated with Grain Growth in Solid Solution Cu(Ni) Thin Films." Thin Solid Films, vol. 558, Elsevier B.V., pp. 170–75, 2014, doi: 10.1016/j.tsf.2014.03.009
Liu, X.,, et al. "Comparison of Crystal Orientation Mapping-Based and Image-Based Measurement of Grain Size and Grain Size Distribution in a Thin Aluminum Film." Acta Materialia, vol. 79, Acta Materialia Inc., pp. 138–45, 2014, doi: 10.1016/j.actamat.2014.07.014
Choi, D.,, et al. "Failure of Semiclassical Models to Describe Resistivity of Nanometric, Polycrystalline Tungsten Films." Journal of Applied Physics, vol. 115, no. 10,, 2014, doi: 10.1063/1.4868093
Liu, X.,, et al. "Interfacial Orientation and Misorientation Relationships in Nanolamellar Cu/Nb Composites Using Transmission-Electron-Microscope-Based Orientation and Phase Mapping." Acta Materialia, vol. 64, Acta Materialia Inc., pp. 333–44, 2014, doi: 10.1016/j.actamat.2013.10.046
Choi, D., et al. "The Electron Scattering at Grain Boundaries in Tungsten Films." Microelectronic Engineering, vol. 122, Elsevier B.V., pp. 5–8, 2014, doi: 10.1016/j.mee.2014.03.012
D Choi, et al. "Failure of semiclassical models to describe resistivity of nanometric, polycrystalline tungsten films", 2014, doi: https://aip.scitation.org/doi/abs/10.1063/1.4868093
JM Cabrera-Anaya - 2014 - tel.archives-ouvertes.fr, et al. "Growth of zinc whiskers", 2014, doi: https://tel.archives-ouvertes.fr/tel-01298169/
P Zhang, et al. "Microstructural evolution, mechanical properties and deformation mechanisms of nanocrystalline Cu thin films alloyed with Zr", 2014, doi: https://www.sciencedirect.com/science/article/pii/S1359645414002924
K Theuwissen, et al. "Nano-scale orientation mapping of graphite in cast irons", 2014, doi: https://www.sciencedirect.com/science/article/pii/S1044580314001983
F Ruiz‐Zepeda, et al. "Precession electron diffraction‐assisted crystal phase mapping of metastable c‐GaN films grown on (001) GaAs", 2014, doi: https://analyticalsciencejournals.onlinelibrary.wiley.com/doi/abs/10.1002/jemt.22424
H Ho, et al. "Quantitative transmission electron microscopy analysis of multi-variant grains in present L10-FePt based heat assisted magnetic recording media", 2014, doi: https://aip.scitation.org/doi/abs/10.1063/1.4902082
S Blumstengel, et al. "Texture and morphology of ZnO grown on nanocrystalline p-sexiphenyl thin films", 2014, doi: https://www.sciencedirect.com/science/article/pii/S0022024814003558
D Biró, et al. "Texture change of TiN films due to anisotropic incorporation of oxygen", 2014, doi: https://www.sciencedirect.com/science/article/pii/S0042207X13004065
Colla, M. S.,, et al. "Dislocation-Mediated Relaxation in Nanograined Columnar Palladium Films Revealed by on-Chip Time-Resolved HRTEM Testing." Nature Communications, vol. 6, no. May Nature Publishing Group, pp. 1–8, 2015, doi: 10.1038/ncomms6922
Rutkowski,, et al. "A novel approach to the characterization of thin oxide layers", Materials Letters,, 2015, doi: http://dx.doi.org/10.1016/j.matlet.2016.02.104
Liu, X.,, et al. "Grain Size Dependence of the Twin Length Fraction in Nanocrystalline Cu Thin Films via Transmission Electron Microscopy Based Orientation Mapping." Journal of Materials Research, vol. 30, no. 4, pp. 528–37, 2015, doi: 10.1557/jmr.2014.393
Aebersold, A. B.,, et al. "Height-Resolved Quantification of Microstructure and Texture in Polycrystalline Thin Films Using TEM Orientation Mapping." Ultramicroscopy, vol. 159, no. P1, Elsevier, pp. 112–23, 2015, doi: 10.1016/j.ultramic.2015.08.005
Kobler, A.,, et al. "Nanotwinned Silver Nanowires: Structure and Mechanical Properties." Acta Materialia, vol. 92, pp. 299–308, 2015, doi: 10.1016/j.actamat.2015.02.041
Mompiou, F.,, et al. "Quantitative Grain Growth and Rotation Probed by In-Situ TEM Straining and Orientation Mapping in Small Grained Al Thin Films." Scripta Materialia, vol. 99, Acta Materialia Inc., pp. 5–8, 2015, doi: 10.1016/j.scriptamat.2014.11.004
J Wang, et al. "Effect of MgO underlayer misorientation on the texture and magnetic property of FePt–C granular film", 2015, doi: DOI:10.1016/j.actamat.2015.03.007
SB Lee, et al. "Effects of film stress and geometry on texture evolution before and after the martensitic transformation in a nanocrystalline Co thin film", 2015, doi: DOI:10.1007/s11661-015-2778-7
AB Aebersold, et al. "Height-resolved quantification of microstructure and texture in polycrystalline thin films using TEM orientation mapping", 2015, doi: https://doi.org/10.1016/j.ultramic.2015.08.005
JE Sanchez, et al. "Precession Electron Diffraction and Orientation Phase Mapping of Assembled Ag/ZnO Nanoantennas", 2015, doi: https://www.cambridge.org/core/journals/microscopy-and-microanalysis/article/precession-electron-diffraction-and-orientation-phase-mapping-of-assembled-agzno-nanoantennas/B067B14EA5AB05DFF225F702F0B44DCE
T LaGrange, et al. "Preferential void formation at crystallographically ordered grain boundaries in nanotwinned copper thin films", 2015, doi: https://www.sciencedirect.com/science/article/pii/S1359645415003985
ASTAR>ASTAR THIN FILMS, MULTILAYERS, NANOWIRES, et al. "Quantitative grain growth and rotation probed by in-situ TEM straining and orientation mapping in small grained Al thin films", 2015, doi: https://www.sciencedirect.com/science/article/pii/S135964621400459X
Rutkowski, B.,, et al. "A Novel Approach to the Characterization of Thin Oxide Layers." Materials Letters, vol. 173, Elsevier, pp. 235–38, 2016, doi: 10.1016/j.matlet.2016.02.104
Barmak, K.,, et al. "On Twin Density and Resistivity of Nanometric Cu Thin Films." Journal of Applied Physics, vol. 120, no. 6,, 2016, doi: 10.1063/1.4960701
B Rutkowski, et al. "A novel approach to the characterization of thin oxide layers", 2016, doi: https://doi.org/10.1016/j.matlet.2016.02.104
D Bufford, et al. "In Situ TEM Study of Fatigue Crack Growth of Cu Thin Films Using a Modified Nanoindentation System", 2016, doi: https://doi.org/10.1002/9783527808465.EMC2016.5791
FF Abdeljawad - 2016 - osti.gov, et al. "Microstructural evolution of thin polycrystalline metallic films under extreme conditions.", 2016, doi: https://www.osti.gov/servlets/purl/1562840
P Cizek, et al. "Microstructure and texture of electrodeposited nanocrystalline nickel in the as-deposited state and after in-situ and ex-situ annealing", 2016, doi: https://link.springer.com/article/10.1007/s11661-016-3810-2
JJ Roa, et al. "Surface grain size and texture after annealing ground zirconia", 2016, doi: https://www.sciencedirect.com/science/article/pii/S0955221915302818
Pli_ingrová, E.,, et al. "2D-Titanium Dioxide Nanosheets Modified with Nd, Ag and Au: Preparation, Characterization and Photocatalytic Activity." Catalysis Today, vol. 281,pp.165–80, 2017, doi: 10.1016/j.cattod.2016.08.013
Wang, K.,, et al. "Morphologies of Tungsten Nanotendrils Grown under Helium Exposure." Scientific Reports, Nature Publishing Group, vol. 7, 42315, 2017, doi: 10.1038/srep42315
Kobler, A.,, et al. "Challenges in Quantitative Crystallographic Characterization of 3D Thin Films by ACOM-TEM." Ultramicroscopy, vol. 173, Elsevier, pp. 84–94, 2017, doi: 10.1016/j.ultramic.2016.07.007
Wiezorek, J. M. K.,, et al. "Composition and Crystal Orientation Mapping of Nano-Scale Multi-Phase Rapid Solidification Microstructures in Hypo-Eutectic Al-Cu Alloy Thin Films." Microscopy and Microanalysis, vol. 23, no. S1, pp. 1078–79,, 2017, doi: 10.1017/s1431927617006055
Ghamarian, I.,, et al. "Determination of the Five Parameter Grain Boundary Character Distribution of Nanocrystalline Alpha-Zirconium Thin Films Using Transmission Electron Microscopy." Acta Materialia, vol. 130, Elsevier Ltd, pp. 164–76, 2017, doi: 10.1016/j.actamat.2017.03.041
Rottmann, P. F.,, et al. "Experimental Observations of Twin Formation during Thermal Annealing of Nanocrystalline Copper Films Using Orientation Mapping." Scripta Materialia, vol. 141, Acta Materialia Inc., pp. 76–79, 2017, doi: 10.1016/j.scriptamat.2017.07.029
Häusler, I.,, et al. "Orientation Relationships of Mn0.75Ga0.25As Crystallites on and within GaAs Determined by Scanning Nano Beam Electron Diffraction." Crystal Research and Technology, vol. 52, no. 1, pp. 1–8, 2017, doi: 10.1002/crat.201600261
Ortega, E.,, et al. "Phase Identification of III-N Thin Films Grown by Molecular Beam Epitaxy and Migration Enhanced Epitaxy Using Precession Electron Diffraction." Microscopy and Microanalysis, vol. 23, no. S1, pp. 1484–85, 2017, doi: 10.1017/s143192761700808x
Rohrer, G. S.,, et al. "The Grain Boundary Character Distribution of Highly Twinned Nanocrystalline Thin Film Aluminum Compared to Bulk Microcrystalline Aluminum." Journal of Materials Science, vol. 52, no. 16, Springer US, pp. 9819–33, 2017, doi: 10.1007/s10853-017-1112-8
Nikolaos Tsavdaris, et al. "A Chemical Vapor Deposition Route to Epitaxial Superconducting NbTiN Thin Films", Chem. Mater. 29, 5824_5830, 2017, doi: 10.1021/acs.chemmater.7b00490
N Tsavdaris, et al. "A chemical vapor deposition route to epitaxial superconducting NbTiN thin films", 2017, doi: https://pubs.acs.org/doi/abs/10.1021/acs.chemmater.7b00490
PF Rottmann, et al. "Experimental observations of twin formation during thermal annealing of nanocrystalline copper films using orientation mapping", 2017, doi: https://doi.org/10.1016/j.scriptamat.2017.07.029
L Cao, et al. "Mechanistic Insights for Low-Overpotential Electroreduction of CO2 to CO on Copper Nanowires", 2017, doi: https://pubs.acs.org/doi/abs/10.1021/acscatal.7b03107
GS Rohrer, et al. "The grain boundary character distribution of highly twinned nanocrystalline thin film aluminum compared to bulk microcrystalline aluminum", 2017, doi: https://link.springer.com/article/10.1007/s10853-017-1112-8
SY Lee, et al. "Transmission orientation imaging of copper thin films on polyimide substrates intended for flexible electronics", 2017, doi: https://www.sciencedirect.com/science/article/pii/S1359646217302890
L. Cao, et al. "Mechanistic Insights for Low-Overpotential Electroreduction of CO2 to CO on Copper Nanowires", 2017, doi: https://pubs.acs.org/doi/10.1021/acscatal.7b03107
Zhou, X.,, et al. "Influence of Solute Partitioning on the Microstructure and Growth Stresses in Nanocrystalline Fe(Cr) Thin Films." Thin Solid Films, vol. 648, no. September Elsevier, pp. 83–93, 2018, doi: 10.1016/j.tsf.2018.01.007
Guo, Q.,, et al. "In-Situ Indentation and Correlated Precession Electron Diffraction Analysis of a Polycrystalline Cu Thin Film." JOM, vol. 70, no. 7, Springer US, pp. 1081–87, 2018, doi: 10.1007/s11837-018-2854-8
Zhou, X.,, et al. "Phase and Microstructures in Sputter Deposited Nanocrystalline Fe–Cr Thin Films." Materialia, vol. 3, no. July, Elsevier Ltd, pp. 295–303, 2018, doi: 10.1016/j.mtla.2018.07.007
Parajuli, P.,, et al. "The Evolution of Growth, Crystal Orientation, and Grain Boundaries Disorientation Distribution in Gold Thin Films." Crystal Research and Technology, vol. 53, no. 8, pp. 1–7, 2018, doi: 10.1002/crat.201800038
Y Parsa, et al. "Effect of oxygen partial pressure on the semiconducting properties of thermally grown chromia on pure chromium", 2018, doi: https://doi.org/10.1016/j.corsci.2018.06.038
H Mun, et al. "Highly fluidic liquid at homointerface generates grain-boundary dislocation arrays for high-performance bulk thermoelectrics", 2018, doi: https://www.sciencedirect.com/science/article/pii/S1359645418306645
X Zhou, et al. "Influence of solute partitioning on the microstructure and growth stresses in nanocrystalline Fe (Cr) thin films", 2018, doi: https://www.sciencedirect.com/science/article/pii/S0040609018300154
P Jacquet, et al. "On the solid-state dewetting of polycrystalline thin films: Capillary versus grain growth approach", 2018, doi: https://www.sciencedirect.com/science/article/pii/S1359645417306572
X Zhou, et al. "Phase and microstructures in sputter deposited nanocrystalline Fe–Cr thin films", 2018, doi: https://www.sciencedirect.com/science/article/pii/S2589152918300462
F Baxter, et al. "Phase stability of zirconium oxide films during focused ion beam milling", 2018, doi: https://www.sciencedirect.com/science/article/pii/S0022311518302794
F Mercier, et al. "Reactive chemical vapor deposition of heteroepitaxial Ti 1− x Al x N films", 2018, doi: https://pubs.rsc.org/en/content/articlehtml/2018/ce/c7ce02129a
Ugarte, D.,, et al. "Analysis of Structural Distortion in Eshelby Twisted InP Nanowires by Scanning Precession Electron Diffraction." Nano Research, vol. 12, no. 4, pp.939–46, 2019, doi: 10.1007/s12274-019-2328-5
Sandfeld, S.,, et al. "Datasets for the Analysis of Dislocations at Grain Boundaries and during Vein Formation in Cyclically Deformed Ni Micropillars." Data in Brief, vol. 27, Elsevier Ltd, p. 104724, 2019, doi: 10.1016/j.dib.2019.104724
Zhao, H.,, et al. "Geometrical Constraints on the Bending Deformation of Penta-Twinned Silver Nanowires." Acta Materialia, vol. 185, Elsevier Ltd, pp. 110–18, 2019, doi: 10.1016/j.actamat.2019.11.058
D Ugarte, et al. "Analysis of structural distortion in Eshelby twisted InP nanowires by scanning precession electron diffraction", 2019, doi: https://doi.org/10.1007/s12274-019-2328-5
W. Roberts, et al. "Low temperature growth and optical properties of _-Ga2O3 deposited on sapphire by plasma enhanced atomic layer deposition", Journal of Crystal Growth 528 125254, 2019, doi: 10.1016/j.jcrysgro.2019.125254
P. B. Barna, et al. "Cross sectional complex structure analysis is a key issue of thin film research: A case study on the preferential orientation crossover in TiN thin films", thin Solid Films 688, 137478, 2019, doi: 10.1016/j.tsf.2019.137478
X.Zhou, et al. "Comparison of Solute Partitioning between Nanocrystalline Sputtered Thin Films and Ball Milled Cu-Zr", 2019, doi: DOI:10.2139/ssrn.3509314
PB Barna, et al. "Cross sectional complex structure analysis is a key issue of thin film research: A case study on the preferential orientation crossover in TiN thin films", 2019, doi: https://doi.org/10.1016/j.tsf.2019.137478
JW Roberts, et al. "Low temperature growth and optical properties of α-Ga2O3 deposited on sapphire by plasma enhanced atomic layer deposition", 2019, doi: https://www.sciencedirect.com/science/article/pii/S0022024819304695
Prakash Parajuli, et al. "Misorientation Dependence Grain Boundary Complexions in Al Alloy Thin Films", 2019, doi: https://papers.ssrn.com/sol3/papers.cfm?abstract_id=3384329
Samaee, V.,, et al. "Dislocation Structures and the Role of Grain Boundaries in Cyclically Deformed Ni Micropillars." Materials Science and Engineering A, vol. 769, no. May Elsevier B.V., p. 138295, 2020, doi: 10.1016/j.msea.2019.138295
Andersen, I. M.,, et al. "Exotic Transverse-Vortex Magnetic Configurations in CoNi Nanowires." ACS Nano, vol. 14, no. 2, pp. 1399–405, 2020, doi: 10.1021/acsnano.9b07448
Brian Aebersold, et al. "Triplet grain growth in a -texture polycrystalline ZnO thin films", Acta Materialia 199 523-529, 2020, doi: http://creativecommons.org/licenses/by-nc-nd/4.0/
Tatu Pinomaa, et al. "Phase field modeling of rapid resolidification of Al-Cu thin films", Journal of Crystal Growth 532 125418, 2020, doi: 10.1016/j.jcrysgro.2019.125418
Zheng Zhang, et al. "Fatigue life enhancement in alpha/beta Ti–6Al–4V after shot peening: An EBSD and TEM crystallographic orientation mapping study of surface layer", Materialia 12 100813, 2020, doi: 10.1016/j.mtla.2020.100813
James E. Nathaniel II, et al. "The influence of solute on irradiation damage evolution in nanocrystalline thin-films", Journal of Nuclear Materials, 2020, doi: 10.1016/j.jnucmat.2020.152616
H Rueß, et al. "Effect of target power density on the chemical composition, phase formation, and mechanical properties of MAX-phase Cr2AlC coatings and prediction of …", 2020, doi: DOI:10.1016/j.jeurceramsoc.2020.10.072
AB Aebersold, et al. "Triplet grain growth in a-texture polycrystalline ZnO thin films", 2020, doi: https://www.sciencedirect.com/science/article/pii/S1359645420306789
X Luo, et al. "Antiferroelectric properties of ZrO2 ultra-thin films prepared by atomic layer deposition", 2021, doi: https://aip.scitation.org/doi/abs/10.1063/5.0051068
Z Zhang, et al. "Cold spray deposition of Inconel 718 in comparison with atmospheric plasma spray deposition", 2021, doi: https://doi.org/10.1016/j.apsusc.2020.147704
A Moll, et al. "Coupling powder bed additive manufacturing and vapor phase deposition methods for elaboration of coated 3D Ti-6Al-4V architectures with enhanced surface …", 2021, doi: https://doi.org/10.1016/j.surfcoat.2021.127130
D Yadav, et al. "Persistence of crystal orientations across sub-micron-scale “super-grains” in self-organized Cu-W nanocomposites", 2021, doi: https://www.sciencedirect.com/science/article/pii/S1359646220307995
A Eggeman, et al. "Twist boundary defects in penta-twinned silver nanowires", 2021, doi: https://www.cambridge.org/core/journals/microscopy-and-microanalysis/article/twist-boundary-defects-in-pentatwinned-silver-nanowires/7A90A53F2594531EF4830A7371543968
H Lee, et al. "Unveiling the Origin of Robust Ferroelectricity in Sub-2 nm Hafnium Zirconium Oxide Films", 2021, doi: https://pubs.acs.org/doi/abs/10.1021/acsami.1c08718
M. Yankova, et al. "Untangling competition between epitaxial strain and growth stress through examination of variations in local oxidation DOI: 10.21203/rs.3.rs-926825/v1", 2022, doi: https://www.researchsquare.com/article/rs-926825/v1