ELECTRIC - MAGNETIC FIELD MAPPING LITERATURE
Zweck, J. N. Chapman, S. McVitie, and H. Hoffmann, et al. “Magnetic microstructure of sputtered Co-Cr films”, Magn. Magn. Mater 104–107, 315, 1922, doi: https://doi.org/10.1016/0304-8853(93)91362-B
J. N. Chapman, P. E. Batson, E. M. Waddell, and R. P. Ferrier, et al. “The direct determination of magnetic domain wall profiles by differential phase contrast electron microscopy”, Ultramicroscopy 3, 203, 1978, doi: https://doi.org/10.1016/S0304-3991(78)80027-8
B. Haas, J.-L. Rouvière, V. Boureau, R. Berthier, D. Cooper, et al. “Direct comparison of off-axis holography and differential phase contrast for the mapping of electric fields in semiconductors by transmission electron microscopy”, Ultramicroscopy, 198, 58., 2019, doi: https://doi.org/10.1016/j.ultramic.2018.12.003
L. Bruas,1 V. Boureau,1,2 A. P. Conlan,1 S. Martinie,1 J.-L. Rouviere,3 and D. Cooper1, et al. “Electron beam induced current microscopy of silicon p–n junctions in a scanning transmission electron microscope ”, J. Appl. Phys. 127, 205703, 2020, doi: https://doi.org/10.1063/5.0040243
V. S. Chejarla, S. Ahmed, J. Belz, J. Scheunert, A. Beyer, et al. “Measuring Spatially-Resolved Potential Drops at Semiconductor Hetero-Interfaces Using 4D-STEM”, K. Small Methods 2300453, 2023, doi: https://doi.org/10.1002/smtd.202300453