PRECESSION: GENERAL LITERATURE :

    • Vincent, R.; Midgley, P.A., et al. "Double conical beam-rocking system for measurement of integrated electron diffraction intensities". Ultramicroscopy. 53 (3): 271–82, 1994, doi: 10.1016/0304-3991(94)90039-6

    • Gjønnes, K., et al. "On the Integration of Electron Diffraction Intensities in the Vincent- Midgley Precession Technique." Ultramicroscopy, vol. 69, no. 1, pp. 1–11, 1997, doi: 10.1016/S0304-3991(97)00031-4

    • J.Gjonnes,V.Hansen, BS Berg, P.Runde, YF Gheng, K.Gjonnes,DL Dorset ,C.Gilmore, et al. Acta Crystallogr , A54, 306-319, 1998, doi:

    • BS Berg,V.Hansen, PA Midgley, J Gjonnes, et al. Ultramicroscopy 74 (1998) 147-157, 1998, doi: 10.1016/S0304-3991(98)00038-2

    • Own, C. S., et al. PhD thesis, System Design and Verification of the Precession Electron Diffraction Technique, Northwestern University, 2005, doi: http://www.numis.northwestern.edu/Research/Current/precession.shtml

    • Own, C. S.,, et al. "Precession Electron Diffraction 1: Multislice Simulation." Acta Crystallographica Section A: Foundations of Crystallography, vol. 62, no. 6, pp. 434–43, 2006, doi: 10.1107/S0108767306032892

    • Avilov, A.,, et al. "Precession Technique and Electron Diffractometry as New Tools for Crystal Structure Analysis and Chemical Bonding Determination." Ultramicroscopy, vol. 107, no. 6–7, pp. 431–44, 2007, doi: 10.1016/j.ultramic.2006.09.006

    • Nicolopoulos, S.,, et al. "From Powder Diffraction to Structure Resolution of Nanocrystals by Precession Electron Diffraction." Zeitschrift Fur Kristallographie, Supplement, vol. 1, no. 26, pp. 183–88, 2007, doi: 10.1524/zksu.2007.2007.suppl_26.183

    • Ciston, J.,, et al. "Precession Electron Diffraction: Optimized Experimental Conditions to Detect Valence Charge Density." Microscopy and Microanalysis, vol. 13, no. S02, pp. 2006–07, 2007, doi: 10.1017/s1431927607073667

    • Sinkler, W.,, et al. "Statistical Treatment of Precession Electron Diffraction Data with Principal Components Analysis." Microscopy and Microanalysis, vol. 13, no. S02, pp. 954–55, 2007, doi: 10.1017/s1431927607072844

    • Ciston, J.,, et al. "A Quantitative Analysis of the Cone-Angle Dependence in Precession Electron Diffraction." Ultramicroscopy, vol. 108, no. 6, pp. 514–22, 2008, doi: 10.1016/j.ultramic.2007.08.004

    • Zou, X.,, et al. "Electron Crystallography: Imaging and Single-Crystal Diffraction from Powders." Acta Crystallographica Section A: Foundations of Crystallography, vol. 64, no. 1, pp. 149–60, 2008, doi: 10.1107/S0108767307060084

    • Hovmöller, S.,, et al. "High quality electron diffraction data by precession" EMC 14th European Microscopy Congress 1–5 September Aachen, Germany, vol. 1, pp. 767–68, 2008, doi: 10.1007/978-3-540-85156-1

    • Morniroli, J. P.,, et al. "LACDIF, a New Electron Diffraction Technique Obtained with the LACBED Configuration and a Cs Corrector: Comparison with Electron Precession." Ultramicroscopy, vol. 108, no. 2, pp. 100–15, 2008, doi: 10.1016/j.ultramic.2007.03.006

    • Eggeman, A. S.,, et al. "Towards a quantitative understanding of precession electron diffraction" EMC 14th European Microscopy Congress 1–5 September Aachen, Germany, vol. 1, no. 1948, pp. 189–90, 2008, doi: 10.1007/978-3-540-85156-1

    • P Moeck, et al. "Structural fingerprinting of nanocrystals in the transmission electron microscope", 2009, doi: https://ieeexplore.ieee.org/abstract/document/5378047/

    • W Sinkler, et al. "Characteristics of precession electron diffraction intensities from dynamical simulations", 2010, doi: https://doi.org/10.1524/zkri.2010.1199

    • Barnard, J. S.,, et al. "Dislocation Electron Tomography and Precession Electron Diffraction – Minimising the Effects of Dynamical Interactions in Real and Reciprocal Space." Philosophical Magazine, vol. 90, no. 35–36, pp. 4711–30, 2010, doi: 10.1080/14786430903581338

    • Eggeman, A. S.,, et al. "Is Precession Electron Diffraction Kinematical? Part II. A Practical Method to Determine the Optimum Precession Angle." Ultramicroscopy, vol. 110, no. 7, Elsevier, pp. 771–77, 2010, doi: 10.1016/j.ultramic.2009.10.012

    • Pokrant, S.,, et al. "Performance of Corrected Transmission Electron Microscopes in Combination with an In-Column Filter and a Distortion-Free Monochromator." Microscopy and Microanalysis, vol. 16, no. Suppl 2, pp. 6–7, 2010, doi: 10.1017/S14319276100

    • Rebled, J. M.,, et al. "A New Approach for 3D Reconstruction from Bright Field TEM Imaging: Beam Precession Assisted Electron Tomography." Ultramicroscopy, vol. 111, no. 9–10, pp. 1504–11, 2011, doi: 10.1016/j.ultramic.2011.06.002

    • Benner, G.,, et al. "Nano Beam Diffraction and Precession in an Energy Filtered CS Corrected Transmission Electron Microscope." Crystal Research and Technology, 2011, doi: 10.1002/crat.201000582

    • Y Liao, et al. "New insights into hard phases of CoCrMo metal-on-metal hip replacements", 2012, doi: https://www.sciencedirect.com/science/article/pii/S1751616112000938

    • Y Liao, et al. "On the alignment for precession electron diffraction", 2012, doi: https://www.sciencedirect.com/science/article/pii/S0304399112000630

    • Eggeman, Alexander S.; Midgley, Paul A., et al. "Precession Electron Diffraction". In Hawkes, Peter W. (ed.). Advances in Imaging and Electron Physics. 170. pp. 1–6, 2012, doi: 10.1016/B978-0-12-394396-5.00001-4

    • Moeck, P.,, et al. "Crystallite Thickness Estimates from Precession Electron Diffraction Patterns for Structural Fingerprinting in the Quasi-Kinematic Limit." Microscopy and Microanalysis, vol. 18, no. Suppl 2, pp. 562–63, 2012, doi: 10.1017/S1431927612004667

    • Estradé, S.,, et al. "EELS Signal Enhancement by Means of Beam Precession in the TEM." Ultramicroscopy, vol. 116, pp. 135–37, 2012, doi: 10.1016/j.ultramic.2012.03.018

    • Liao, Y.,, et al. "On the Alignment for Precession Electron Diffraction." Ultramicroscopy, vol. 117, Elsevier, pp. 1–6, 2012, doi: 10.1016/j.ultramic.2012.03.021

    • Eggeman, A. S.,, et al. "Precession Electron Diffraction." Advances in Imaging and Electron Physics, vol. 170, Elsevier Inc, 2012, doi: 10.1016/B978-0-12-394396-5.00001-4

    • Y Liao, et al. "Reduction of electron channeling in EDS using precession", 2013, doi: https://www.sciencedirect.com/science/article/pii/S0304399112002860

    • Eggeman, A. S.,, et al. "Aberration-Corrected and Energy-Filtered Precession Electron Diffraction." Zeitschrift Fur Kristallographie, vol. 228, no. 1, pp. 43–50, 2013, doi: 10.1524/zkri.2013.1565

    • Liao, Y.,, et al. "Reduction of Electron Channeling in EDS Using Precession." Ultramicroscopy, vol. 126, Elsevier, pp. 19–22, 2013, doi: 10.1016/j.ultramic.2012.11.007

    • Palatinus, L., et al. "The Charge-Flipping Algorithm in Crystallography." Acta Crystallographica Section B: Structural Science, Crystal Engineering and Materials, vol. 69, no. 1, International Union of Crystallography, pp. 1–16, 2013, doi: 10.1107/S2052519212051366

    • Yedra, L,, et al. "Precessed Electron Beam Electron Energy Loss Spectroscopy of Graphene: Beyond Channelling Effects." Applied Physics Letters, vol. 105, no. 5, pp. 2012–15, 2014, doi: 10.1063/1.4892825

    • PA Midgley, et al. "Precession electron diffraction–a topical review", 2015, doi: https://scripts.iucr.org/cgi-bin/paper?s2052252514022283

    • Midgley, P. A.,, et al. "Precession Electron Diffraction – A Topical Review." IUCrJ, vol. 2, International Union of Crystallography, pp. 126–36, 2015, doi: 10.1107/S2052252514022283

    • Zuo, J. M.,, et al. "Solving Difficult Structures with Electron Diffraction." IUCrJ, vol. 2, pp. 7–8, 2015, doi: 10.1107/S2052252514026797

    • Barnard, J. S.,, et al. "High-Resolution Scanning Precession Electron Diffraction: Alignment and Spatial Resolution." Ultramicroscopy, vol. 174, no. September Elsevier B.V., pp. 79–88, 2017, doi: 10.1016/j.ultramic.2016.12.018

    • Plana-Ruiz, S.,, et al. "Quasi-Parallel Precession Diffraction: Alignment Method for Scanning Transmission Electron Microscopes." Ultramicroscopy, vol. 193, no. April Elsevier B.V., pp. 39–51, 2018, doi: 10.1016/j.ultramic.2018.06.005

    • Kodjikian, S.,, et al. "Low-Dose Electron Diffraction Tomography (LD-EDT)." Ultramicroscopy, vol. 200, no. February, pp. 12–19, 2019, doi: 10.1016/j.ultramic.2019.02.010

    • RWH Webster - 2020 - theses.gla.ac.uk, et al. "Precise nanoscale characterisation of novel Heusler thermoelectrics via analytical electron microscopy", 2020, doi: https://theses.gla.ac.uk/81684/

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