Extending TEM capabilities with Scanning Precession Electron Diffraction (PED)

Dr. Jing Lu, Application scientist NanoMEGAS USA


In this webinar, Dr. Jing Lu will explain how modern TEM microscopes benefit from PED,  a breakthrough in electron crystallography, now commonly used for synchronized scanning and precession (4D-STEM). In this presentation we will show how the NanoMEGAS  system provides streamlined PED  acquisition with automated precession alignments and analysis featuring ASTAR orientation /phase mapping and Topspin strain mapping while achieving high spatial resolution and precision