ADVANCED IMAGING AND DIFFRACTION TOOLS FOR TRANSMISSION ELECTRON MICROSCOPY
ACOM/TEM (ASTAR) : Automated crystal orientation mapping with TEMs
Dr. Edgar Rauch SiMAP Laboratory CNRS France
In this webinar Dr. Rauch introduces the coupling of scanning Precession Electron diffraction patterns (4D-STEM) with template matching approach to generate orientation and phase maps (ASTAR system). As evidenced by the many published studies (more than 500 papers published using ASTAR since 2009) this technique is well suited to characterize local orientation and phase maps (up to 1-2 nm resolution) in metals , alloys, minerals , nanostructures etc.. Using virtual apertures in ASTAR/ 4D-STEM images and correlation coefficient maps, superimposed secondary phases, hidden dislocations /defects and amorphous areas can be clearly highlighted in the material under examination.
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