HITACHI interface - Nanomegas

ADVANCED IMAGING AND DIFFRACTION TOOLS FOR TRANSMISSION ELECTRON MICROSCOPY

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DIGISTAR/ASTAR- HITACHI Microscopes

Imagen 20

Hitachi HF5000

Imagen 5

CCD side entry (for 35 mm port) Optomechanical camera mount for HF5000 microscope

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PRODUCTS

TEM strain mapping analysis – ASTAR
TEM orientation imaging
3D Diffraction tomography
4D STEM with topspin platform
Analysis of amorphous materials
Enhanced EDX/EELS spectroscopy
Electron crystallography Software
Installations

RESOURCES

Precession Electron Diffractionand Applications
Application Notes
Literature

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Webinar Webinar Extending TEM capabilities with Scanning Precession Electron Diffraction (PED) - Dr. Jing Lu

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Webinar Webinar The use of Precession Diffraction for in situ Cross-correlative microscopy - Prof. Greg Thomson

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Webinar Webinar Advance Characterization of materials using PED /ACOM (ASTAR) - Partha Ghosal

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Webinar Webinar Local structure at the nanoscale (e-PDF) - Prof. Simon Billinge

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Webinar Webinar Structural Characterization in TEM by Electron Pair Distribution function (e-PDF) - Partha das

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Webinar Webinar Applications of orientation and phase maps in metallurgy - Prof. Muriel Veron

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Webinar Webinar Structural Characterization in TEM by 3D Electron Diffraction / Micro-ED - Partha Das

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Webinar Webinar ACOM/TEM (ASTAR) : Automated crystal orientation mapping with TEMs - Dr. Edgar Rauch

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Webinar Webinar ASTAR a tool to characterize Na mechanism inside individual crystals of Na-ion battery materials - Arnaud Demortière

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Webinar Webinar Coupling in-situ TEM and ACOM-ASTAR to characterize GB motion - Romain Gautier

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