“Strain Measurement at the Nanoscale: Comparison between Convergent Beam Electron Diffraction, Nano-Beam Electron Diffraction, High Resolution Imaging and Dark Field Electron Holography.” Ultramicroscopy, vol. 131, no. Elsevier, pp. 10–23

by emc32-adm | Jan 1, 2013 | 0 comments

Submit a Comment Cancel reply

Your email address will not be published. Required fields are marked *

Comment *

Name *

Email *

Website

Save my name, email, and website in this browser for the next time I comment.