Materials science properties (metals, alloys, ceramics, semiconductors, nanoparticles) depend on great extent on their textures at nm scale level. ASTAR device uses TEM based orientation mapping technique (EBSD-TEM like) based on collection of precession electron diffraction (PED) patterns and cross-correlation comparison with simulated intensities.

ASTAR can turn any TEM into a very powerful analytical tool enabling orientation–phase imaging at 1 nm resolution attainable (FEG TEM) in combination with other TEM analytical techniques. In combination with TOPSPIN simultaneous orientation/phase/strain /STEM maps are possible.

•ASTAR works with any TEM 120-200-300 KV (LaB6/FEG)

•ASTAR orientation-phase map 1 nm resolution attainable with TEM-FEG

•ASTAR may work with any type of diffracting material (inorganic, organic) using standard TEM specimen preparation techniques

•ASTAR works in combination with precession diffraction (Patent pending technique) device DigiSTAR for ultra-precise orientation/phase maps

•ASTAR can work / retrofit between multiple TEMs in same lab

•Galvanic isolation system (GIS) via optical fiber for ASTAR-TEM connection

•In combination with TOPSPIN simultaneous orientation /phase /strain /STEM maps are possible

ACOM/TEM (ASTAR) : Automated crystal orientation mapping with TEMs

Dr. Edgar Rauch SiMAP Laboratory CNRS France

Applications of orientation and phase maps in metallurgy

Prof. Muriel Veron, CNRS Grenoble INP France


Texture of metals is linked to
specific physical properties so the
need to characterize it at nm scale
with novel ASTAR orientation
imaging technique.

Faster chip performances in electronic
devices push copper interconnects at
< 3 nm scale , so the need
for novel TEM based texture
ASTAR characterization technique.

Nanoparticle crystal structure and texture
are very importan for drug delivery and
catalysis properties and need novel TEM
characterization techniques.

Crystalline polymers and other
organics need new techniques
for structure characterization in

Textures of minerals at nm scale
are intimately linked to their
physical & chemical properties
so the need for novel TEM
characterization techniques

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