EVENTS
Fronteers of Characterization and Metrology for Nanoelectronics
25-28 March
NIST Gaithersburg USA
Powder and Electron Crystallography workshop
8-12 July
Univ of Patras
PICO 2013 Fronteers of aberration corrected electron microscopy
9-12 Oct-2013 Kasteel Vaalsbroek , The Netherlands
EMAG Conference, York UK
Workshop on Precession Electron Diffraction, and Orientation & Strain Mapping in TEM
8 Nov 2013 UCLA
Electron Crystallography School – Introduction to electron diffraction tomography
07.4.2014 – 11.04.2014, Darmstadt
EVENTS
ASTAR and graphene research on Italian television
ASTAR has been used to check the crystal quality of graphene in the research carried out by the Istituto Italiano di Tecnologia at the Center for Nanotechnology Innovation@NEST in Pisa, Italy. More>
Researchers at Cambridge University and NanoMEGAS
reveal detailed organic thin film structure with ASTAR
TEM orientation mapping, is becoming an increasingly popular and important technique. There has been significant instrumental development in recent years by the SME involved in JRA1, Nanomegas, enabling precession electron diffraction (PED) patterns to be acquired pixel by pixel across a scanned area. Such 4D data sets can be analysed to provide high resolution (ca. 1nm) phase-identification and orientation maps.
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