8th Microscopy Winter School

Analysis of Diffraction data in real space

January 19-24, 2014
ETH and University of Zurich, Switzerland

Electron Backscatter Diffraction (EBSD) Meeting

March 31 – April 1, 2014
Charles Darwin House, London, UK

Microscience Microscopy Congress
2014 (mmc2014)

July 1-3, 2014
Manchester Central, Manchester, UK


September 7-12, 2014
Prague, Czech Republic

XV International Conference on
Electron Microscopy

September 15-18, 2014
Kraków, Poland


2nd International Multidisciplinary Microscopy and Microanalysis Congress and Exhibition
October 16-19, 2014


ASTAR and graphene research on Italian television

ASTAR has been used to check the crystal quality of graphene in the research carried out by the Istituto Italiano di Tecnologia at the Center for Nanotechnology Innovation@NEST in Pisa, Italy. More>

Researchers at Cambridge University and NanoMEGAS
reveal detailed organic thin film structure with ASTAR

TEM orientation mapping, is becoming an increasingly popular and important technique. There has been significant instrumental development in recent years by the SME involved in JRA1, Nanomegas, enabling precession electron diffraction (PED) patterns to be acquired pixel by pixel across a scanned area. Such 4D data sets can be analysed to provide high resolution (ca. 1nm) phase-identification and orientation maps.
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